[go: up one dir, main page]
More Web Proxy on the site http://driver.im/

Singh et al., 2019 - Google Patents

Non-Destructive Testing of Metal Backed Materials Using Reflection Mode Terahertz Spectroscopy

Singh et al., 2019

View PDF
Document ID
7205182953361184814
Author
Singh S
Tiwari N
Akhtar M
Publication year
Publication venue
2019 URSI Asia-Pacific Radio Science Conference (AP-RASC)

External Links

Snippet

In this paper, we propose and demonstrate an accurate, fast and thickness independent reflection mode terahertz spectroscopy technique to determine the material parameters of the test specimen. A generalized closed form expression is derived to extract the index of …
Continue reading at www.researchgate.net (PDF) (other versions)

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infra-red light
    • G01N21/3581—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infra-red light using far infra-red light; using Terahertz radiation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infra-red light
    • G01N21/3577—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infra-red light for analysing liquids, e.g. polluted water
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/8422—Investigating thin films, e.g. matrix isolation method
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by the preceding groups
    • G01N33/26—Investigating or analysing materials by specific methods not covered by the preceding groups oils; viscous liquids; paints; inks
    • G01N33/28—Oils, i.e. hydrocarbon liquids
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by the preceding groups
    • G01N33/02—Investigating or analysing materials by specific methods not covered by the preceding groups food
    • G01N33/14—Investigating or analysing materials by specific methods not covered by the preceding groups food beverages
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electro-chemical, or magnetic means
    • G01N27/02—Investigating or analysing materials by the use of electric, electro-chemical, or magnetic means by investigating the impedance of the material
    • G01N27/22—Investigating or analysing materials by the use of electric, electro-chemical, or magnetic means by investigating the impedance of the material by investigating capacitance
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical means
    • G01B11/02—Measuring arrangements characterised by the use of optical means for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical means for measuring length, width or thickness for measuring thickness, e.g. of sheet material
    • G01B11/0616—Measuring arrangements characterised by the use of optical means for measuring length, width or thickness for measuring thickness, e.g. of sheet material of coating
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/44—Processing the detected response signal, e.g. electronic circuits specially adapted therefor
    • G01N29/46—Processing the detected response signal, e.g. electronic circuits specially adapted therefor by spectral analysis, e.g. Fourier analysis or wavelet analysis
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N22/00—Investigating or analysing materials by the use of microwaves
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/02—Indexing codes associated with the analysed material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N25/00—Investigating or analyzing materials by the use of thermal means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R23/00—Arrangements for measuring frequencies; Arrangements for analysing frequency spectra

Similar Documents

Publication Publication Date Title
Scheller Data extraction from terahertz time domain spectroscopy measurements
EP2899498B1 (en) Sensor system and method for characterizing a coated body
Dorney et al. Material parameter estimation with terahertz time-domain spectroscopy
Kniffin et al. Model-based material parameter estimation for terahertz reflection spectroscopy
Wu et al. Application of terahertz time domain spectroscopy for NDT of oxide-oxide ceramic matrix composites
Jin et al. Experimental measurements of water content in crude oil emulsions by terahertz time-domain spectroscopy
Krüger et al. Uncertainty and ambiguity in terahertz parameter extraction and data analysis
CN108918458B (en) Method for determining terahertz absorption peak of material
Meng et al. Highly sensitive terahertz non‐destructive testing technology for stone relics deterioration prediction using SVM-based machine learning models
CN103645154A (en) Method for extracting material optical constant by using terahertz spectral signal
Krimi et al. Inline multilayer thickness sensing by using terahertz time-domain spectroscopy in reflection geometry
Cassar et al. Iterative tree algorithm to evaluate terahertz signal contribution of specific optical paths within multilayered materials
Singh et al. Calibration independent estimation of optical constants using terahertz time‐domain spectroscopy
Choi et al. Nondestructive evaluation of multilayered paint films in ambient atmosphere using terahertz reflection spectroscopy
CN112304895A (en) Method for determining complex dielectric function of semiconductor material
Withayachumnankul et al. Simple material parameter estimation via terahertz time-domain spectroscopy
Fan et al. Enhanced Measurement of Paper Basis Weight Using Phase Shift in Terahertz Time‐Domain Spectroscopy
Zhang et al. Extension of terahertz time-domain spectroscopy: A micron-level thickness gauging technology
Singh et al. Non-Destructive Testing of Metal Backed Materials Using Reflection Mode Terahertz Spectroscopy
Iwata et al. Prediction of the thickness of a thin paint film by applying a modified partial-least-squares-1 method to data obtained in terahertz reflectometry
Mukherjee et al. A review on numerical methods for thickness determination in terahertz time-domain spectroscopy
Pałka et al. Monitoring of air voids at plastic-metal interfaces by terahertz radiation
Faridi et al. 1.5 port vector Spectrometer for terahertz time Domain spectroscopy
Zhao et al. Application of terahertz time-domain spectroscopy in nondestructive testing of adhesion quality
van Ravenswaay et al. A Method for the Extraction of Frequency-Dependent Material Parameters of Multilayer Systems from Terahertz Spectroscopy Measurements