[go: up one dir, main page]
More Web Proxy on the site http://driver.im/

Xia et al., 2024 - Google Patents

Active Probe AFM Imaging and Nanofabrication

Xia et al., 2024

Document ID
7162006617082144175
Author
Xia F
Rangelow I
Youcef-Toumi K
Publication year
Publication venue
Active Probe Atomic Force Microscopy: A Practical Guide on Precision Instrumentation

External Links

Snippet

This chapter introduces the applications of active cantilever probes for imaging and nanofabrication in AFM systems. Initially, an overview of the system integration procedure for developing active probe AFMs is provided, along with a comparison to passive probe …
Continue reading at link.springer.com (other versions)

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q60/00—Particular type of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
    • G01Q60/24—AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes
    • G01Q60/38—Probes, their manufacture, or their related instrumentation, e.g. holders
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q60/00—Particular type of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
    • G01Q60/24—AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes
    • G01Q60/32—AC mode
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q70/00—General aspects of SPM probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single SPM technique covered by group G01Q60/00
    • G01Q70/08—Probe characteristics
    • G01Q70/10—Shape or taper
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q30/00—Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q10/00—Scanning or positioning arrangements, i.e. arrangements for actively controlling the movement or position of the probe

Similar Documents

Publication Publication Date Title
Rangelow et al. Active scanning probes: A versatile toolkit for fast imaging and emerging nanofabrication
Onaran et al. A new atomic force microscope probe with force sensing integrated readout and active tip
Eaton et al. Atomic force microscopy
Favre et al. Parallel AFM imaging and force spectroscopy using two‐dimensional probe arrays for applications in cell biology
Kaestner et al. Advanced electric-field scanning probe lithography on molecular resist using active cantilever
Kaestner et al. Scanning probes in nanostructure fabrication
JP2002543439A (en) Integrated micro column and scanning probe microscope array
Ivanova et al. Scanning proximal probes for parallel imaging and lithography
Angelov et al. Six-axis AFM in SEM with self-sensing and self-transduced cantilever for high speed analysis and nanolithography
Ahmad et al. Fast atomic force microscopy with self-transduced, self-sensing cantilever
Akiyama et al. Implementation and characterization of a quartz tuning fork based probe consisted of discrete resonators for dynamic mode atomic force microscopy
Yang et al. High-speed atomic force microscopy in ultra-precision surface machining and measurement: challenges, solutions and opportunities
Rangelow Scanning proximity probes for nanoscience and nanofabrication
Gotszalk et al. Tip-based nano-manufacturing and-metrology
Holz et al. Correlative microscopy and nanofabrication with AFM integrated with SEM
Alipour et al. A high bandwidth microelectromechanical system-based nanopositioner for scanning tunneling microscopy
Lee et al. Cantilever with integrated resonator for application of scanning probe microscope
Disseldorp et al. MEMS-based high speed scanning probe microscopy
Holz et al. High throughput AFM inspection system with parallel active cantilevers
Xia et al. Active Probe AFM Imaging and Nanofabrication
Findeisen et al. Control on a molecular scale: a perspective
Morita et al. Japan AFM roadmap 2006
Raina Atomic force microscopy as a nanometrology tool: some issues and future targets
Sulania et al. Atomic and magnetic force studies of co thin films and nanoparticles: understanding the surface correlation using fractal studies
Meyer et al. Introduction to scanning probe microscopy