[go: up one dir, main page]
More Web Proxy on the site http://driver.im/

Jargon et al., 2009 - Google Patents

Correcting sampling oscilloscope timebase errors with a passively mode-locked laser phase locked to a microwave oscillator

Jargon et al., 2009

View PDF
Document ID
7119976718986542675
Author
Jargon J
Hale P
Wang C
Publication year
Publication venue
IEEE Transactions on Instrumentation and Measurement

External Links

Snippet

In this paper, we describe an apparatus for correcting the timebase errors when calibrating the response of an equivalent-time sampling oscilloscope using a passively mode-locked erbium-doped fiber laser that is phase locked to a microwave signal generator. This enables …
Continue reading at tsapps.nist.gov (PDF) (other versions)

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/308—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/39—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using tunable lasers
    • G01N2021/396—Type of laser source
    • G01N2021/399—Diode laser
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31708—Analysis of signal quality
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R13/00—Arrangements for displaying electric variables or waveforms
    • G01R13/02—Arrangements for displaying electric variables or waveforms for displaying measured electric variables in digital form
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/20—Arrangements or instruments for measuring magnetic variables involving magnetic resonance
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R23/00—Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
    • G01R23/02—Arrangements for measuring frequency, e.g. pulse repetition rate Arrangements for measuring period of current or voltage
    • G01R23/14—Arrangements for measuring frequency, e.g. pulse repetition rate Arrangements for measuring period of current or voltage by heterodyning; by beat-frequency comparison
    • G01R23/145—Arrangements for measuring frequency, e.g. pulse repetition rate Arrangements for measuring period of current or voltage by heterodyning; by beat-frequency comparison by heterodyning or by beat-frequency comparison with the harmonic of an oscillator
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/28—Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks using network analysers Measuring transient response

Similar Documents

Publication Publication Date Title
Clement et al. Calibration of sampling oscilloscopes with high-speed photodiodes
Zhang et al. Amplitude to phase conversion of InGaAs pin photo-diodes for femtosecond lasers microwave signal generation
Taylor et al. Characterization of power-to-phase conversion in high-speed PIN photodiodes
Ivanov et al. Analysis of noise mechanisms limiting the frequency stability of microwave signals generated with a femtosecond laser
Helbing et al. Carrier-envelope offset phase-locking with attosecond timing jitter
Füser et al. Optoelectronic time-domain characterization of a 100 GHz sampling oscilloscope
Wang et al. Sequential estimation of timebase corrections for an arbitrarily long waveform
Jargon et al. Correcting sampling oscilloscope timebase errors with a passively mode-locked laser phase locked to a microwave oscillator
Degenhardt et al. Influence of chirped excitation pulses in an optical clock with ultracold calcium atoms
Reader et al. Comb-generator characterization
Duan et al. Injection transient study using a two-frequency bunch length measurement system at the SSRF
Sucha et al. A new method for rapid temporal scanning of ultrafast lasers
Henderson et al. Calibration of fast sampling oscilloscopes
Yamada et al. Theoretical analysis and experimental demonstration of a chirped pulse-train generator and its potential for efficient cooling of positronium
Struszewski et al. Asynchronous optical sampling for laser-based vector network analysis on coplanar waveguides
Bieler et al. Ultrafast optics establishes metrological standards in high-frequency electronics
Risaro et al. Improving the resolution of comb-based frequency measurements using a track-and-hold amplifier
Salzenstein et al. Optoelectronic phase noise system designed for microwaves photonics sources measurements in metrology application
Humphreys et al. Vector calibration of optical reference receivers using a frequency-domain method
Henderson et al. A comparison of spectral and temporal techniques for the measurement of timing jitter and their application in a modelocked argon ion and dye laser system
Smith et al. Optoelectronic techniques for improved high speed electrical risetime
Khayatzadeh et al. Noise characterization of an Optical Frequency Comb using Offline Cross-Correlation
Tankeliun et al. Hybrid time-base device for coherent sampling oscilloscope
DE102012024692B3 (en) Phase noise measuring instrument
Liu et al. Electro-Optic Modulator Based Beam Arrival Time Monitor for SXFEL