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De Silva et al., 2016 - Google Patents

An optimized nano-positioning stage for Bristol's Transverse Dynamic Force Microscope

De Silva et al., 2016

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Document ID
7036343644606488038
Author
De Silva G
Burgess S
Hatano T
Khan S
Zhang K
Nguyen T
Herrmann G
Edwards C
Miles M
Publication year
Publication venue
IFAC-PapersOnLine

External Links

Snippet

This paper presents the design process for the optimisation of a nano-precision actuation stage for a Transverse Dynamic Force Microscope (TDFM). A TDFM is an advanced type of Atomic Force microscope (AFM) that does not contact the specimen and therefore has …
Continue reading at research-information.bris.ac.uk (PDF) (other versions)

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q60/00—Particular type of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
    • G01Q60/24—AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes
    • G01Q60/38—Probes, their manufacture, or their related instrumentation, e.g. holders
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q10/00—Scanning or positioning arrangements, i.e. arrangements for actively controlling the movement or position of the probe
    • G01Q10/04—Fine scanning or positioning
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
    • G01N2203/0058—Kind of property studied
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q70/00—General aspects of SPM probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single SPM technique covered by group G01Q60/00
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q30/00—Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices

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De Silva et al. ... Miles, M.(2016). An optimized nano-positioning stage for Bristol’s Transverse Dynamic Force Microscope. In 7th IFAC Symposium on Mechatronic Systems & 15th Mechatronics Forum International Conference: Loughborough, United Kingdom, 5-8 September 2016 (pp. 120-126).(IFAC
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