Fuchs, 2015 - Google Patents
Optical spectroscopy on silicon vacancy defects in silicon carbideFuchs, 2015
- Document ID
- 6992490434712326955
- Author
- Fuchs F
- Publication year
External Links
- 229910010271 silicon carbide 0 title abstract description 244
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
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