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Bei et al., 2008 - Google Patents

Spatially resolved strain measurements in Mo-alloy micropillars by differential aperture x-ray microscopy

Bei et al., 2008

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Document ID
6978902848596509831
Author
Bei H
Barabash R
Ice G
Liu W
Tischler J
George E
Publication year
Publication venue
Applied Physics Letters

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Snippet

Spatially resolved strain distributions in the NiAl matrix and the∼ 550–1000 nm Mo fibers of a NiAl–Mo eutectic were investigated by microbeam x-ray diffraction. Position sensitive d- spacings for the individual phases were obtained from spatially resolved and energy …
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