Allport, 1977 - Google Patents
Dual beam x-ray thickness gaugeAllport, 1977
View PDF- Document ID
- 6932329905826120001
- Author
- Allport J
- Publication year
External Links
Snippet
Apparatus and method for continuous measurement of thickness of a sheet at a rolling mill or the like without contacting the sheet. A system directing radiation through the sheet in two energy bands and providing a measure of change in composition of the material as it passes …
- 238000010521 absorption reaction 0 abstract description 58
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons by transmitting the radiation through the material
- G01N23/06—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons by transmitting the radiation through the material and measuring the absorption
- G01N23/08—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons by transmitting the radiation through the material and measuring the absorption using electric detection means
- G01N23/16—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons by transmitting the radiation through the material and measuring the absorption using electric detection means the material being a moving sheet or a sheet or tube examined by a scanning probe
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons by transmitting the radiation through the material
- G01N23/06—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons by transmitting the radiation through the material and measuring the absorption
- G01N23/08—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons by transmitting the radiation through the material and measuring the absorption using electric detection means
- G01N23/09—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons by transmitting the radiation through the material and measuring the absorption using electric detection means the radiation being neutrons
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B15/00—Measuring arrangements characterised by the use of wave or particle radiation
- G01B15/02—Measuring arrangements characterised by the use of wave or particle radiation for measuring thickness
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/07—Investigating materials by wave or particle radiation secondary emission
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US4037104A (en) | Dual beam X-ray thickness gauge | |
| US4047029A (en) | Self-compensating X-ray or γ-ray thickness gauge | |
| JPS5922161B2 (en) | radiation thickness gauge | |
| Ederer et al. | Photoionization Cross Section of Neon in the 80 to 600 Å Region | |
| EP0075190B1 (en) | Apparatus for measuring thickness | |
| US4119846A (en) | Non-contacting gage apparatus and method | |
| US2988641A (en) | Production of sheet materials | |
| US4088886A (en) | Radiation thickness gauge for sheet material | |
| WO1983001113A1 (en) | Methods and apparatus for x-ray analysis of rapidly moving multicomponent materials | |
| Allport | Dual beam x-ray thickness gauge | |
| US5204889A (en) | Apparatus for measuring thickness of metals on a rolling mill | |
| US4916727A (en) | Apparatus for measuring the voltage applied to a radiation source | |
| US3121166A (en) | X-ray apparatus for measuring paper web density | |
| US4803715A (en) | Thickness measurement with automatic correction for changes in composition | |
| US3417244A (en) | X-ray thickness gauge with correction for specimen composition | |
| US5400380A (en) | Dynamic alloy correction gauge | |
| Byard | Absolute gƒ-values for Fe I | |
| US3004163A (en) | Radiation gauging system | |
| KR100491019B1 (en) | Multipoint thickness measurement system | |
| Allport et al. | Backscatter/transmission X-ray thickness gauge | |
| JPS6079207A (en) | Thickness measurement of plate by radiation | |
| US3832542A (en) | Wide range radiation gage having a controlled-gain photodetector for determining a material property | |
| Tsujii et al. | Radiation thickness gauge | |
| WO1984002399A1 (en) | A method for producing the radiological image of an object, preferably for use in material testing, and a means for its performance | |
| Syke | A gamma ray thickness gauge for hot steel strips and tubes |