Bockris et al., 1964 - Google Patents
The anodic formation of calomel films on mercury electrodes—an ellipsometric-galvanostatic studyBockris et al., 1964
- Document ID
- 6721333245535945981
- Author
- Bockris J
- Devanathan M
- Reddy A
- Publication year
- Publication venue
- Proceedings of the Royal Society of London. Series A. Mathematical and Physical Sciences
External Links
Snippet
The mechanism of formation of calomel films on mercury electrodes in 1 M potassium chloride solutions has been investigated by combining conventional galvanostatic techniques with a new application of ellipsometry. In this application, the ability of surface …
- ZOMNIUBKTOKEHS-UHFFFAOYSA-L Mercury(I) chloride 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Cl[Hg][Hg]Cl 0 title abstract description 98
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electro-chemical, or magnetic means
- G01N27/26—Investigating or analysing materials by the use of electric, electro-chemical, or magnetic means by investigating electrochemical variables; by using electrolysis or electrophoresis
- G01N27/416—Systems
- G01N27/42—Measuring disposition or liberation of materials from an electrolyte; Coulometry, i.e. measuring coulomb-equivalent of material in an electrolyte
- G01N27/423—Coulometry
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electro-chemical, or magnetic means
- G01N27/26—Investigating or analysing materials by the use of electric, electro-chemical, or magnetic means by investigating electrochemical variables; by using electrolysis or electrophoresis
- G01N27/416—Systems
- G01N27/4166—Systems measuring a particular property of an electrolyte
- G01N27/4167—Systems measuring a particular property of an electrolyte pH
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/55—Specular reflectivity
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
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- G—PHYSICS
- G02—OPTICS
- G02F—DEVICES OR ARRANGEMENTS, THE OPTICAL OPERATION OF WHICH IS MODIFIED BY CHANGING THE OPTICAL PROPERTIES OF THE MEDIUM OF THE DEVICES OR ARRANGEMENTS FOR THE CONTROL OF THE INTENSITY, COLOUR, PHASE, POLARISATION OR DIRECTION OF LIGHT, e.g. SWITCHING, GATING, MODULATING OR DEMODULATING; TECHNIQUES OR PROCEDURES FOR THE OPERATION THEREOF; FREQUENCY-CHANGING; NON-LINEAR OPTICS; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating, or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating, or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating, or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N33/00—Investigating or analysing materials by specific methods not covered by the preceding groups
- G01N33/48—Investigating or analysing materials by specific methods not covered by the preceding groups biological material, e.g. blood, urine; Haemocytometers
- G01N33/50—Chemical analysis of biological material, e.g. blood, urine; Testing involving biospecific ligand binding methods; Immunological testing
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/71—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
- G01N21/74—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited using flameless atomising, e.g. graphite furnaces
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- G—PHYSICS
- G02—OPTICS
- G02F—DEVICES OR ARRANGEMENTS, THE OPTICAL OPERATION OF WHICH IS MODIFIED BY CHANGING THE OPTICAL PROPERTIES OF THE MEDIUM OF THE DEVICES OR ARRANGEMENTS FOR THE CONTROL OF THE INTENSITY, COLOUR, PHASE, POLARISATION OR DIRECTION OF LIGHT, e.g. SWITCHING, GATING, MODULATING OR DEMODULATING; TECHNIQUES OR PROCEDURES FOR THE OPERATION THEREOF; FREQUENCY-CHANGING; NON-LINEAR OPTICS; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating, or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating, or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/15—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating, or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on electrochromic elements
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Young et al. | An Ellipsometric Study of Steady‐State High Field Ionic Conduction in Anodic Oxide Films on Tantalum, Niobium, and Silicon | |
Itoh et al. | In situ surface-enhanced Raman scattering spectroelectrochemistry of oxygen species | |
Śmietana et al. | Study on Combined Optical and Electrochemical Analysis Using Indium‐tin‐oxide‐coated Optical Fiber Sensor | |
Schröder et al. | Microscopic in situ diffuse reflectance spectroelectrochemistry of solid state electrochemical reactions of particles immobilized on electrodes | |
Shewchun et al. | Ellipsometric technique for obtaining substrate optical constants | |
Kolb | SPECTROSCOPIE ET RÉFLECTANCEREFLECTANCE SPECTROSCOPY IN THE STUDY OF ELECTRODE SURFACES | |
Novak et al. | An ellipsometric study of surface films on copper electrodes undergoing electropolishing | |
Mo et al. | Simultaneous microgravimetric and optical reflectivity studies of lithium underpotential deposition on Au (111) from propylene carbonate electrolytes | |
Woolf | Tracer diffusion of hydrogen ion in aqueous alkali chloride solutions at 25 | |
Ohtsuka et al. | Ellipso-reflectometry applied to the study of passivating films on nickel | |
Masing et al. | Optical Properties of Anodic Oxide Films on Tantalum, Niobium, and Tantalum+ Niobium Alloys, and the Optical Constants of Tantalum | |
Awakura et al. | Profile of the Refractive Index in the Cathodic Diffusion Layer of an Electrolyte Containing CuSO4 and H 2 SO 4 | |
Heusler et al. | Ellipso-reflectometry at nickel in sulphuric acid solutions | |
Beaglehole et al. | Dielectric constant of gold, copper, and gold-copper alloys between 18 and 35 eV | |
Reddy et al. | The mechanism of passivation of nickel as determined by an automatic recording ellipsometer | |
Fujishima et al. | Measurement of gold electrode surface changes in situ by laser photothermal spectroscopy | |
Lee et al. | Ionic Current as a Function of Field in the Oxide during Plasma Anodization of Tantalum and Niobium | |
Naegele et al. | Kramers-Kronig analysis for the determination of the optical constants of thin surface films: II. Application to platinum oxide films |