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Busch et al., 2002 - Google Patents

A glossary for mass spectrometry

Busch et al., 2002

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Document ID
6481124590639935376
Author
Busch K
et al.
Publication year
Publication venue
Mass Spectrometry

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Snippet

Kenneth L. Busch (buschken@ hotmail. com) is a scientist at the National Science Foundation (Arlington, VA); any views and opinions expressed in this article are his and not those of the National Science Foundation. He has been involved with mass spectrometry …
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Classifications

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    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H01J49/4205—Device types
    • H01J49/422—Two-dimensional RF ion traps
    • H01J49/4225—Multipole linear ion traps, e.g. quadrupoles, hexapoles
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    • H01J49/10—Ion sources; Ion guns
    • H01J49/16—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission
    • H01J49/161—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission using photoionisation, e.g. by laser
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    • H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H01J49/4205—Device types
    • H01J49/424—Three-dimensional ion traps, i.e. comprising end-cap and ring electrodes
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    • H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H01J49/4205—Device types
    • H01J49/421—Mass filters, i.e. deviating unwanted ions without trapping
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    • H01J49/107—Arrangements for using several ion sources
    • H—ELECTRICITY
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    • H01J49/426—Methods for controlling ions
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    • H01J49/0045—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn characterised by the fragmentation or other specific reaction
    • H01J49/0059—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn characterised by the fragmentation or other specific reaction by a photon beam, photo-dissociation
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    • H01J49/0036—Step by step routines describing the handling of the data generated during a measurement
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    • H01J49/0045—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn characterised by the fragmentation or other specific reaction
    • H01J49/0054—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn characterised by the fragmentation or other specific reaction by an electron beam, e.g. electron impact dissociation, electron capture dissociation
    • H—ELECTRICITY
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    • H01J49/14—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers
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    • H—ELECTRICITY
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    • H01J49/00—Particle spectrometer or separator tubes
    • H01J49/0009—Calibration of the apparatus

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