[go: up one dir, main page]
More Web Proxy on the site http://driver.im/

Alvarez et al., 1997 - Google Patents

The AMS program at the TANDAR accelerator

Alvarez et al., 1997

View PDF
Document ID
645842676736735932
Author
Alvarez D
Niello J
Di Tada M
Ferrero A
Marti G
Capurro O
Pacheco A
Testoni J
Abriola D
Etchegoyen A
Achterberg E
Ramirez M
Publication year
Publication venue
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

External Links

Snippet

The accelerator mass spectrometry (AMS) program that is under development using the 20UD electrostatic accelerator TANDAR at Buenos Aires is presented. Tests and measurements in order to evaluate and to improve the accelerator performance are …
Continue reading at www.academia.edu (PDF) (other versions)

Classifications

    • H—ELECTRICITY
    • H01—BASIC ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometer or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H01J49/4205—Device types
    • H—ELECTRICITY
    • H01—BASIC ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometer or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/28—Static spectrometers
    • H01J49/30—Static spectrometers using magnetic analysers, e.g. Dempster spectrometer
    • H—ELECTRICITY
    • H01—BASIC ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometer or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H—ELECTRICITY
    • H01—BASIC ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometer or separator tubes
    • H01J49/02—Details
    • H01J49/025—Detectors specially adapted to particle spectrometers
    • H—ELECTRICITY
    • H01—BASIC ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometer or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/28—Static spectrometers
    • H01J49/32—Static spectrometers using double focusing
    • H—ELECTRICITY
    • H01—BASIC ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometer or separator tubes
    • H01J49/02—Details
    • H01J49/06—Electron- or ion-optical arrangements
    • H—ELECTRICITY
    • H01—BASIC ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometer or separator tubes
    • H01J49/02—Details
    • H01J49/022—Circuit arrangements, e.g. for generating deviation currents or voltages ; Components associated with high voltage supply
    • H—ELECTRICITY
    • H01—BASIC ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometer or separator tubes
    • H01J49/02—Details
    • H01J49/22—Electrostatic deflection
    • H—ELECTRICITY
    • H01—BASIC ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement, ion-optical arrangement
    • H—ELECTRICITY
    • H01—BASIC ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometer or separator tubes
    • H01J49/44—Energy spectrometers, e.g. alpha-, beta-spectrometers
    • H—ELECTRICITY
    • H01—BASIC ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/244—Detection characterized by the detecting means
    • H01J2237/2449—Detector devices with moving charges in electric or magnetic fields
    • H—ELECTRICITY
    • H01—BASIC ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/153—Correcting image defects, e.g. stigmators
    • H01J2237/1538—Space charge (Boersch) effect compensation
    • H—ELECTRICITY
    • H01—BASIC ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J47/00—Tubes for determining the presence, intensity, density or energy of radiation or particles

Similar Documents

Publication Publication Date Title
Jesch et al. The MR-TOF-MS isobar separator for the TITAN facility at TRIUMF
US4973841A (en) Precision ultra-sensitive trace detector for carbon-14 when it is at concentration close to that present in recent organic materials
Cui et al. Design and operation of a retarding field energy analyzer with variable focusing for space-charge-dominated electron beams
Stan-Sion et al. A new AMS facility based on a Cockcroft–Walton type 1 MV tandetron at IFIN-HH Magurele, Romania
Weissman et al. Conversion of 92MeV/u 38Ca/37K projectile fragments into thermalized ion beams
CN100561221C (en) A kind of accelerator mass spectrometry device and accelerator mass spectrometry 14The C measuring method
Mori et al. Further evaluation of the high intensity plasma sputter heavy negative ion source
US5621209A (en) Attomole detector
Schroeder et al. Initial results with low energy single stage AMS
Okumura et al. Application of a multi‐turn time‐of‐flight mass spectrometer, MULTUM II, to organic compounds ionized by matrix‐assisted laser desorption/ionization
Alvarez et al. The AMS program at the TANDAR accelerator
Bailey Crossed Electric and Magnetic Field Multichannel Ion Analyzer
Lobanov et al. Bunching and chopping for tandem accelerators. Part I: Bunching
Welch et al. A low energy cyclotron for radiocarbon dating
Heck et al. Dipolar and quadrupolar detection using an FT-ICR MS setup at the MPIK Heidelberg
Oura et al. Experimental setups for photoionization of multiply charged ions by synchrotron radiation
Suzuki et al. Efficiency and timing performance of time-of-flight detector utilizing thin foils and crossed static electric and magnetic fields for mass measurements with Rare-RI Ring facility
Cornejo et al. A preparation Penning trap for the TRAPSENSOR project with prospects for MATS at FAIR
Vockenhuber et al. Accelerator mass spectrometry of the heaviest long-lived radionuclides with a 3-MV tandem accelerator
Welch et al. A 40 keV cyclotron for radioisotope dating
Donohue et al. Positron ionization mass spectrometry. I: instrumentation
Jeong et al. Development of a portable time-of-flight mass spectrometer prototype using a cold electron source
Kalinin et al. Ion source with longitudinal ionization of a molecular beam by an electron beam in a magnetic field
US5969354A (en) Electron analyzer with integrated optics
Anderson et al. Klystron bunching of the ion beam of a 5.5 MV Van de Graaff