Roth et al., 2020 - Google Patents
Snapshot 3D reconstruction of liquid surfacesRoth et al., 2020
View HTML- Document ID
- 6396699256888782560
- Author
- Roth A
- Kristensson E
- Berrocal E
- Publication year
- Publication venue
- Optics Express
External Links
Snippet
In contrast to static objects, liquid structures such as drops, blobs, as well as waves and ripples on water surfaces are challenging to image in 3D due to two main reasons: first, the transient nature of those phenomena requires snapshot imaging that is fast enough to freeze …
- 239000007788 liquid 0 title abstract description 58
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
- G01N21/4795—Scattering, i.e. diffuse reflection spatially resolved investigating of object in scattering medium
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
- G01N21/49—Scattering, i.e. diffuse reflection within a body or fluid
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical means
- G01B11/24—Measuring arrangements characterised by the use of optical means for measuring contours or curvatures
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume, or surface-area of porous materials
- G01N15/02—Investigating particle size or size distribution
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T11/00—2D [Two Dimensional] image generation
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING; COUNTING
- G06K—RECOGNITION OF DATA; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS
- G06K9/00—Methods or arrangements for reading or recognising printed or written characters or for recognising patterns, e.g. fingerprints
- G06K9/36—Image preprocessing, i.e. processing the image information without deciding about the identity of the image
- G06K9/46—Extraction of features or characteristics of the image
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons by transmitting the radiation through the material
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T17/00—Three dimensional [3D] modelling, e.g. data description of 3D objects
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
Similar Documents
Publication | Publication Date | Title |
---|---|---|
Cobelli et al. | Global measurement of water waves by Fourier transform profilometry | |
Roth et al. | Snapshot 3D reconstruction of liquid surfaces | |
Huang et al. | Dynamic three-dimensional sensing for specular surface with monoscopic fringe reflectometry | |
Guildenbecher et al. | Digital holography simulations and experiments to quantify the accuracy of 3D particle location and 2D sizing using a proposed hybrid method | |
US8427656B2 (en) | Robust three-dimensional shape acquisition method and system | |
Hullin et al. | Fluorescent immersion range scanning | |
Farmer | Observation of large particles with a laser interferometer | |
Toloui et al. | High fidelity digital inline holographic method for 3D flow measurements | |
Xu et al. | High-accuracy 3D shape measurement of translucent objects by fringe projection profilometry | |
Jiang et al. | 3D shape measurement of translucent objects based on Fourier single-pixel imaging in projector-camera system | |
Gomit et al. | Free-surface flow measurements by non-intrusive methods: a survey | |
Zhang et al. | Spatiotemporal phase unwrapping for the measurement of discontinuous objects in dynamic fringe-projection phase-shifting profilometry | |
Wu et al. | Coal powder measurement by digital holography with expanded measurement area | |
García et al. | Three-dimensional mapping and range measurement by means of projected speckle patterns | |
Gurov et al. | Analysis of low-coherence interference fringes by the Kalman filtering method | |
Mériaudeau et al. | Review and comparison of non-conventional imaging systems for three-dimensional digitization of transparent objects | |
Ouldarbi et al. | Simultaneous 3D location and size measurement of bubbles and sand particles in a flow using interferometric particle imaging | |
van Meerkerk et al. | Scanning stereo-PLIF method for free surface measurements in large 3D domains | |
Du et al. | A boundary migration model for imaging within volumetric scattering media | |
Jain et al. | Total-internal-reflection deflectometry for measuring small deflections of a fluid surface | |
Chen et al. | Optical 3-D profilometry for measuring semiconductor wafer surfaces with extremely variant reflectivities | |
Zhang et al. | Validity of the instrument transfer function for fringe projection metrology | |
Basevi et al. | Simultaneous multiple view high resolution surface geometry acquisition using structured light and mirrors | |
Lombardi et al. | A new dynamic masking technique for time resolved PIV analysis: A new freeware raycasting tool combined with fluorescent coating to allow for object visibility | |
Lu et al. | Improved particle size estimation in digital holography via sign matched filtering |