[go: up one dir, main page]
More Web Proxy on the site http://driver.im/

Belousov, 1985 - Google Patents

The scope for mass discrimination in the leakage magnetic field of a double-focusing mass spectrometer

Belousov, 1985

Document ID
6319721276628178105
Author
Belousov V
Publication year
Publication venue
J. Anal. Chem. USSR (Engl. Transl.);(United States)

External Links

Snippet

Discrimination occurs because of differences in ionization potential, differences in volatility between minor components and the matrix, the wide energy spread in the ions, and so on. To separate ions by mass in a mass spectrometer of Mattauch-Herzog type, fairly strong …
Continue reading at www.osti.gov (other versions)

Classifications

    • H—ELECTRICITY
    • H01—BASIC ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometer or separator tubes
    • H01J49/02—Details
    • H01J49/025—Detectors specially adapted to particle spectrometers
    • H—ELECTRICITY
    • H01—BASIC ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometer or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/14—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers
    • H—ELECTRICITY
    • H01—BASIC ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometer or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/28—Static spectrometers
    • H01J49/30—Static spectrometers using magnetic analysers, e.g. Dempster spectrometer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N30/00—Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
    • G01N30/02—Column chromatography
    • G01N30/62—Detectors specially adapted therefor
    • G01N30/72—Mass spectrometers
    • H—ELECTRICITY
    • H01—BASIC ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometer or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H—ELECTRICITY
    • H01—BASIC ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometer or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H—ELECTRICITY
    • H01—BASIC ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometer or separator tubes
    • H01J49/02—Details
    • H01J49/06—Electron- or ion-optical arrangements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/185—Measuring radiation intensity with ionisation chamber arrangements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electro-chemical, or magnetic means
    • G01N27/62—Investigating or analysing materials by the use of electric, electro-chemical, or magnetic means by investigating the ionisation of gases; by investigating electric discharges, e.g. emission of cathode
    • H—ELECTRICITY
    • H01—BASIC ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H—ELECTRICITY
    • H01—BASIC ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J47/00—Tubes for determining the presence, intensity, density or energy of radiation or particles
    • H01J47/06—Proportional counter tubes
    • H—ELECTRICITY
    • H01—BASIC ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J47/00—Tubes for determining the presence, intensity, density or energy of radiation or particles
    • H01J47/02—Ionisation chambers
    • H—ELECTRICITY
    • H01—BASIC ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J43/00—Secondary-emission tubes; Electron-multiplier tubes
    • H01J43/04—Electron multipliers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons

Similar Documents

Publication Publication Date Title
White MASS SPECTROMETER
Giffin et al. An electro—optical detector for focal plane mass spectrometers
Cornish et al. Miniature time‐of‐flight mass spectrometer using a flexible circuitboard reflector
Belousov The scope for mass discrimination in the leakage magnetic field of a double-focusing mass spectrometer
Wells et al. Mass Spectrometer for the Study of Ion-Molecule Collision Processes
Fancher et al. Improving the sensitivity of the end‐cap reflectron time‐of‐flight mass spectrometer
Fonov et al. Ion source for MKh-7304 mass spectrometer
Bajo et al. Development of electrostatic‐induced charge detector for multiturn time‐of‐flight mass spectrometer
Bishop et al. Y-TUBE MASS SPECTROMETER
Rockwood et al. An electrospray/orthogonal time-of-flight mass spectrometer designed for high sensitivity and on-line separations
Lucenet et al. THEORETICAL STUDY AND REALIZATION OF A MOCK-UP OF A $ beta $ SPECTROGRAPH WITH GREAT LUMINOSITY
RU2187862C2 (en) Facility measuring ion currents of mass spectrometer
Titov Analytical and numerical methods for modeling ion-optic systems of a quadrupole mass spectrometer
Frank Solid sampling time of flight mass spectrometry in a hot cell environment
Koyama et al. Use of a Commercial Electron Multiplier for Positive Ion Counting in Mass Spectrometry
Bozek et al. Electron spectrometer for gas-phase spectroscopy
Gall et al. Registration of currents of positive and negative ions in quadrupole mass spectrometer with one measuring channel
White et al. PULSED ELECTROSTATIC ANALYZER FOR ION ENERGY DETERMINATIONS
Kavalov et al. Time-of-flight heavy-ion spectrometer using detectors with loose dielectric emitters
Matsuda Mass spectrometer
Akishin RADIOACTIVE IONIZATION MANOMETER FOR HIGH VACUUM
Fultz Radiation detector
Doil'nitsyn et al. MINIATURE RADIOFREQUENCY MASS SPECTROMETERS
Nagy SECTOR-TYPE MAGNETIC ANALYSER FOR THE INVESTIGATION OF ION RAYS
Schuy et al. THE DIRECT CURRENT BREAKING SPARK AS NEW ION SOURCE FOR MASS SPECTROSCOPIC INVESTIGATIONS OF SOLID BODIES