Kurt et al., 2019 - Google Patents
Investigation of a hybrid approach for normally-off GaN HEMTs using fluorine treatment and recess etch techniquesKurt et al., 2019
View PDF- Document ID
- 595426821341501631
- Author
- Kurt G
- Gulseren M
- Salkim G
- Ural S
- Kayal O
- Ozturk M
- Butun B
- Kabak M
- Ozbay E
- Publication year
- Publication venue
- IEEE Journal of the Electron Devices Society
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Snippet
A hybrid approach for obtaining normally off high electron mobility transistors (HEMTs) combining fluorine treatment, recess etch techniques, and AlGaN buffer was studied. The effects of process variations (recess etch depth and fluorine treatment duration) and epitaxial …
- 229910002601 GaN 0 title abstract description 32
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