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Keller et al., 1998 - Google Patents

ATPG in Practical and non-Traditional Applications

Keller et al., 1998

Document ID
5646318460050952981
Author
Keller B
McCauley K
Swenton J
Youngs J
Publication year
Publication venue
Proceedings International Test Conference 1998 (IEEE Cat. No. 98CH36270)

External Links

Snippet

There exist many different problems in the design automation realm that have no simple solution. Often a problem requires some kind of search through a potential solution space to see if one or more examples exist to prove or disprove a supposition. In many of these cases …
Continue reading at ieeexplore.ieee.org (other versions)

Classifications

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    • G06F11/263—Generation of test inputs, e.g. test vectors, patterns or sequences; with adaptation of the tested hardware for testability with external testers
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    • G06F11/2215—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test error correction or detection circuits
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    • G06F2217/70—Fault tolerant, i.e. transient fault suppression

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