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Paraman et al., 2017 - Google Patents

TEST REGISTER INSERTION AT RTL BASED ON REDUCED BIST

Paraman et al., 2017

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Document ID
5309940096858471253
Author
Paraman N
Ooi C
Sha'ameri A
Fujiwara H
Publication year
Publication venue
Jurnal Teknologi

External Links

Snippet

Built-in self-test (BIST) method has high area overhead and long test application time. In this paper, a new BIST method is proposed at register transfer level (RTL) as a design for testability (DFT) method to modify a given RTL circuit to a reduced BIST-able RTL circuit …
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Classifications

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