[go: up one dir, main page]
More Web Proxy on the site http://driver.im/

Rodriguez-Navarro, 2007 - Google Patents

Registering pole figures using an X-ray single-crystal diffractometer equipped with an area detector

Rodriguez-Navarro, 2007

View PDF
Document ID
5052396316059761882
Author
Rodriguez-Navarro A
Publication year
Publication venue
Journal of Applied Crystallography

External Links

Snippet

The orientation of crystals in a polycrystalline sample is adequately described using pole figures, displaying the three-dimensional distribution of specific crystallographic directions or poles. Registration of pole figures is necessary to characterize the preferred orientation of …
Continue reading at www.ugr.es (PDF) (other versions)

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons by using diffraction of the radiation, e.g. for investigating crystal structure; by using reflection of the radiation
    • G01N23/207—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons by using diffraction of the radiation, e.g. for investigating crystal structure; by using reflection of the radiation by means of diffractometry using detectors, e.g. using an analysing crystal or a crystal to be analysed in a central position and one or more displaceable detectors in circumferential positions
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons by measuring secondary emission
    • G01N23/225—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons by measuring secondary emission using electron or ion microprobe or incident electron or ion beam
    • G01N23/2251—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons by measuring secondary emission using electron or ion microprobe or incident electron or ion beam with incident electron beam
    • G01N23/2252—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons by measuring secondary emission using electron or ion microprobe or incident electron or ion beam with incident electron beam and measuring excited X-rays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons by using diffraction of the radiation, e.g. for investigating crystal structure; by using reflection of the radiation
    • G01N23/205—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons by using diffraction of the radiation, e.g. for investigating crystal structure; by using reflection of the radiation by means of diffraction cameras
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons by transmitting the radiation through the material and forming a picture
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00—Sampling; Preparing specimens for investigation
    • G01N1/02—Devices for withdrawing samples
    • G01N1/04—Devices for withdrawing samples in the solid state, e.g. by cutting
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons by using diffraction of the radiation, e.g. for investigating crystal structure; by using reflection of the radiation
    • G01N23/20008—Constructional details; Accessories
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00—Sampling; Preparing specimens for investigation
    • G01N1/28—Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q

Similar Documents

Publication Publication Date Title
Wenk et al. Synchrotron texture analysis with area detectors
Lonardelli et al. Texture analysis from synchrotron diffraction images with the Rietveld method: dinosaur tendon and salmon scale
Rodriguez-Navarro XRD2DScan: new software for polycrystalline materials characterization using two-dimensional X-ray diffraction
EP2818852B1 (en) Methods and devices for high throughput crystal structure analysis by electron diffraction
Randau et al. StressTextureCalculator: a software tool to extract texture, strain and microstructure information from area-detector measurements
King et al. First laboratory X-ray diffraction contrast tomography for grain mapping of polycrystals
Portillo et al. Precession electron diffraction assisted orientation mapping in the transmission electron microscope
Bleuet et al. A hard x-ray nanoprobe for scanning and projection nanotomography
Rodriguez-Navarro Registering pole figures using an X-ray single-crystal diffractometer equipped with an area detector
Wenk et al. Rietveld texture analysis of Dabie Shan eclogite from TOF neutron diffraction spectra
CN110441342B (en) Method for accurately representing three-dimensional orientation and crystallographic orientation of crystal
Hrubiak et al. Multimode scanning X-ray diffraction microscopy for diamond anvil cell experiments
Lenthe et al. Quantitative voxel-to-voxel comparison of TriBeam and DCT strontium titanate three-dimensional data sets
Tong et al. TrueEBSD: Correcting spatial distortions in electron backscatter diffraction maps
Winiarski et al. Correction of artefacts associated with large area EBSD
Uchic Serial sectioning methods for generating 3D characterization data of grain-and precipitate-scale microstructures
Garriga Ferrer et al. darfix–data analysis for dark-field X-ray microscopy
JP2003121394A (en) Method for analyzing crystal structure
Tischler Reconstructing 2D and 3D X-ray orientation maps from white-beam Laue
Aebersold et al. Height-resolved quantification of microstructure and texture in polycrystalline thin films using TEM orientation mapping
Daniel et al. Application of a new method for accurate determination of α and β texture in Ti-6Al-4V from synchrotron diffraction intensities
Poulsen et al. Multigrain crystallography and three-dimensional grain mapping
JP6775777B2 (en) How to display the measurement result in X-ray diffraction measurement
CN113155877B (en) Layered mineral or two-dimensional material mixed polytype scanning transmission electron microscope analysis method
Wardini et al. Probing Multiscale Disorder in Pyrochlore and Related Complex Oxides in the Transmission Electron Microscope: A Review