Guckel et al., 1992 - Google Patents
Diagnostic microstructures for the measurement of intrinsic strain in thin filmsGuckel et al., 1992
- Document ID
- 4918424579679440315
- Author
- Guckel H
- Burns D
- Rutigliano C
- Lovell E
- Choi B
- Publication year
- Publication venue
- Journal of Micromechanics and Microengineering
External Links
Snippet
Freestanding flexible microstructures fabricated from deposited thin films become mechanically unstable when internal stresses exceed critical values. A series of structures with varying geometries is used to determine the critical geometry at which buckling occurs …
- 239000010409 thin film 0 title abstract description 10
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
- G01L9/00—Measuring steady or quasi-steady pressure of a fluid or a fluent solid material by electric or magnetic pressure-sensitive elements; Transmitting or indicating the displacement of mechanical pressure-sensitive elements, used to measure the steady or quasi-steady pressure of a fluid or fluent solid material by electric or magnetic means
- G01L9/0041—Transmitting or indicating the displacement of flexible diaphragms
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
- G01L1/00—Measuring force or stress in general
- G01L1/20—Measuring force or stress in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electro-kinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress
- G01L1/22—Measuring force or stress in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electro-kinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress using resistance strain gauges
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