[go: up one dir, main page]
More Web Proxy on the site http://driver.im/

Jarwala et al., 1995 - Google Patents

End-to-end test strategy for wireless systems

Jarwala et al., 1995

Document ID
4887256287175310387
Author
Jarwala M
Le D
Heutmaker M
Publication year
Publication venue
Proceedings of 1995 IEEE International Test Conference (ITC)

External Links

Snippet

This paper proposes an end-to-end test strategy for wireless systems described by using wireless microcell as a vehicle. It presents a framework for resting digital and radio frequency (RF) boards in a wireless system and provides an integrated solution. The test …
Continue reading at ieeexplore.ieee.org (other versions)

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuit
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31926—Routing signals to or from the device under test [DUT], e.g. switch matrix, pin multiplexing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuit
    • G01R31/31903—Tester hardware, i.e. output processing circuit tester configuration
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318505—Test of Modular systems, e.g. Wafers, MCM's
    • G01R31/318508—Board Level Test, e.g. P1500 Standard
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04B—TRANSMISSION
    • H04B17/00—Monitoring; Testing
    • H04B17/10—Monitoring; Testing of transmitters
    • H04B17/15—Performance testing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/3167—Testing of combined analog and digital circuits
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04B—TRANSMISSION
    • H04B17/00—Monitoring; Testing
    • H04B17/0082—Monitoring; Testing using service channels; using auxiliary channels
    • H04B17/0085—Monitoring; Testing using service channels; using auxiliary channels using test signal generators
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04B—TRANSMISSION
    • H04B17/00—Monitoring; Testing
    • H04B17/20—Monitoring; Testing of receivers
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04B—TRANSMISSION
    • H04B7/00—Radio transmission systems, i.e. using radiation field
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04B—TRANSMISSION
    • H04B1/00—Details of transmission systems, not covered by a single one of groups H04B3/00 - H04B13/00; Details of transmission systems not characterised by the medium used for transmission

Similar Documents

Publication Publication Date Title
Jarwala et al. End-to-end test strategy for wireless systems
EP0706271B1 (en) Method and apparatus for integrated testing of a system containing digital and radio frequency circuits
EP1546739B1 (en) Rf chip testing method and system
Lupea et al. RF-BIST: Loopback spectral signature analysis
US7327153B2 (en) Analog built-in self-test module
US7958408B2 (en) On-chip receiver sensitivity test mechanism
US20040266423A1 (en) Test apparatus and method which can simultaneously execute various tests of one or a plurality of radio communication terminals of various types of communication systems
CN101442367B (en) Mobile-terminal simulator for a wireless telecommunications network
US20110218755A1 (en) Integrated circuit and test method therefor
Heutmaker et al. An architecture for self-test of a wireless communication system using sampled IQ modulation and boundary scan
CN101009523B (en) A device and method for automatic measurement of the mobile communication terminal demodulation performance
CN117424840A (en) Software radio platform standard compliance coverage test method
US20030060193A1 (en) Apparatus, method and program for communication test, and recorded medium on which that program has been recorded
CN1168616A (en) Radio characteristic evaluation device for mobile communication equipment
CN101529388B (en) Method for testing non-boundary scanning digital device
JP3463746B2 (en) Certification test system and certification test method
CN108254666B (en) Wafer testing device and method for Bluetooth system level
EP1278317A1 (en) Apparatus, method and program for communication test, and recorded medium on which that program has been recorded
Abdennadher et al. Practices in mixed-signal and RF IC testing
Lupea et al. Spectral Signature Analysis–BIST for RF Front-Ends
US20050070268A1 (en) Method of testing RF circuit, and arrangement
US20020053056A1 (en) Method and apparatus for testing digital circuitry
EP0685074B1 (en) Device for testing the connection between an output of a means which outputs a fixed logic value and the input of a circuit
KR100697276B1 (en) Analog baseband test apparatus and method of mobile communication terminal combining J-tech and memory
Sunwoo et al. High Fault Coverage Built-In Self-Test for 3 rd Generation Mobile Phone User