[go: up one dir, main page]
More Web Proxy on the site http://driver.im/

COHEN et al., 1990 - Google Patents

Crack measurement in metals by the four-point probe technique

COHEN et al., 1990

Document ID
4766029590505070707
Author
COHEN R
West K
Publication year
Publication venue
Materials Evaluation

External Links

Continue reading at scholar.google.com (other versions)

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00Investigating or analysing materials by the use of electric, electro-chemical, or magnetic means
    • G01N27/72Investigating or analysing materials by the use of electric, electro-chemical, or magnetic means by investigating magnetic variables
    • G01N27/82Investigating or analysing materials by the use of electric, electro-chemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
    • G01N27/90Investigating or analysing materials by the use of electric, electro-chemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00Investigating or analysing materials by the use of electric, electro-chemical, or magnetic means
    • G01N27/02Investigating or analysing materials by the use of electric, electro-chemical, or magnetic means by investigating the impedance of the material
    • G01N27/04Investigating or analysing materials by the use of electric, electro-chemical, or magnetic means by investigating the impedance of the material by investigating resistance
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
    • G01N21/84Systems specially adapted for particular applications
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00Investigating or analysing materials by specific methods not covered by the preceding groups
    • G01N33/02Investigating or analysing materials by specific methods not covered by the preceding groups food
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/22Details, e.g. general constructional or apparatus details
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00Investigating or analysing materials by specific methods not covered by the preceding groups
    • G01N33/38Investigating or analysing materials by specific methods not covered by the preceding groups concrete; ceramics; glass; bricks
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N25/00Investigating or analyzing materials by the use of thermal means
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00Measuring arrangements characterised by the use of electric or magnetic means
    • G01B7/34Measuring arrangements characterised by the use of electric or magnetic means for measuring roughness or irregularity of surfaces
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N3/00Investigating strength properties of solid materials by application of mechanical stress
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00Sampling; Preparing specimens for investigation
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00Measuring arrangements characterised by the use of mechanical means
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B3/00Instruments as specified in the subgroups and characterised by the use of mechanical measuring means
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B17/00Measuring arrangements characterised by the use of subsonic, sonic or ultrasonic vibrations
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01KMEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR

Similar Documents

Publication Publication Date Title
CA1269709A (en) Composite analyzer tester
CA2387728A1 (en) Test element analysis system with an infrared detector
CA1270303A (en) Probe for composite analyzer tester
US3885215A (en) Electrode assembly for measuring the effective thickness of thru-hole plating in circuit board workpieces or the like
COHEN et al. Crack measurement in metals by the four-point probe technique
US4042880A (en) Electrode assembly for measuring the effective thickness of thru-hole plating circuit board workpieces
US3637314A (en) Tubing reflectometer
ATE111220T1 (en) MEASURING DEVICE FOR DETERMINING THE DIELECTRIC PROPERTIES OF MATERIALS.
JPS6044857A (en) Crack growth detector for conductive materials
CN216900895U (en) A fixing device that is used for appearance performance check-up is put in ultrasonic wave office
Halliday et al. Potential Difference Applied to the Measurement of Small Fatigue Crack Growth at Notches in Ti--6 Al--4 V
JPS5539009A (en) Meter for rotational accuracy and gap of roller bearing
Telschow et al. Critical Current Measurements of High T sub c Superconductors in a Scanning Low Temperature Cryostat
Clark A high-sensitivity potential-drop technique for fatigue crack growth measurements
KALININ et al. Ultrasonic automatic high-resolution thickness meters with direct-reading systems
Tseitalin Present State and Metrological Assurance in Thickness Gauging of Extra-Thin Coatings
Berger et al. Instruments for inspection of coatings
SU1143186A1 (en) Method of calibration in contact-free x-ray testing
JPS57139629A (en) Non-contact type vibration measuring device
Stolarski Resolution of the Four Contact Method for Studying the Resistivity of Heavily Doped Silicon
SU1744620A1 (en) Method of calibration of electropotential flaw detector
Lange Experience in the Application of the A. C. Potential Probe Method to Determine Crack Propagation
JPH01318950A (en) Detecting method for amount of occulsion of hydrogen in titanium material
Vernon et al. Optimization of eddy current probes for NDT of carbon fiber composites
Balzereit et al. Extensometer Based on Strain Gages(DMS) for Large Extensions and Calibration Procedure for the Extensometer.(Retroactive Coverage)