[go: up one dir, main page]
More Web Proxy on the site http://driver.im/

Teverovsky, 2021 - Google Patents

Effect of Soldering on Polymer and MnO2 Tantalum Capacitors

Teverovsky, 2021

View PDF
Document ID
4737115284701367732
Author
Teverovsky A
Publication year

External Links

Snippet

Soldering might have a strong effect on performance and reliability of most surface mount technology components, including tantalum capacitors. High quality tantalum capacitors are likely the only type of components where soldering simulation is the first step during …
Continue reading at ntrs.nasa.gov (PDF) (other versions)

Classifications

    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01GCAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES OR LIGHT-SENSITIVE DEVICES, OF THE ELECTROLYTIC TYPE
    • H01G4/00Fixed capacitors; Processes of their manufacture
    • H01G4/002Details
    • H01G4/228Terminals
    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01GCAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES OR LIGHT-SENSITIVE DEVICES, OF THE ELECTROLYTIC TYPE
    • H01G9/00Electrolytic capacitors, rectifiers, detectors, switching devices, light-sensitive or temperature-sensitive devices; Processes of their manufacture
    • H01G9/004Details
    • H01G9/08Housing; Encapsulation
    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01GCAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES OR LIGHT-SENSITIVE DEVICES, OF THE ELECTROLYTIC TYPE
    • H01G9/00Electrolytic capacitors, rectifiers, detectors, switching devices, light-sensitive or temperature-sensitive devices; Processes of their manufacture
    • H01G9/004Details
    • H01G9/022Electrolytes, absorbents
    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01GCAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES OR LIGHT-SENSITIVE DEVICES, OF THE ELECTROLYTIC TYPE
    • H01G4/00Fixed capacitors; Processes of their manufacture
    • H01G4/002Details
    • H01G4/018Dielectrics
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02EREDUCTION OF GREENHOUSE GASES [GHG] EMISSION, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E60/00Enabling technologies or technologies with a potential or indirect contribution to GHG emissions mitigation
    • Y02E60/10Energy storage
    • Y02E60/13Ultracapacitors, supercapacitors, double-layer capacitors
    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001Technical content checked by a classifier
    • H01L2924/0002Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/16Fillings or auxiliary members in containers or encapsulations, e.g. centering rings
    • H01L23/18Fillings characterised by the material, its physical or chemical properties, or its arrangement within the complete device

Similar Documents

Publication Publication Date Title
Naguib et al. Silver migration and the reliability of Pd/Ag conductors in thick-film dielectric crossover structures
Shrivastava et al. Failure of polymer aluminum electrolytic capacitors under elevated temperature humidity environments
Teverovsky Popcorning failures in polymer and MnO2 tantalum capacitors
Teverovsky Effect of moisture on AC characteristics of chip polymer tantalum capacitors
Teverovsky Effect of Soldering on Polymer and MnO2 Tantalum Capacitors
Alam et al. Effects of moisture absorption on the electrical parameters of embedded capacitors with epoxy-BaTiO 3 nanocomposite dielectric
Teverovsky Guidelines for Screening, Lot Acceptance, and Derating for Polymer Tantalum Capacitors
Teverovsky Effect of moisture on characteristics of surface mount solid tantalum capacitors
Croswell et al. Embedded mezzanine capacitor technology for printed wiring boards
Prymak Improvements with polymer cathodes in aluminum and tantalum capacitors
JPH01232711A (en) Manufacture of solid electrolytic capacitor
Shrivastava et al. Rapid assessment testing of polymer aluminum electrolytic capacitors in elevated temperature–humidity environments
Teverovsky Effect of Preconditioning on Post-Soldering Failures in Tantalum Capacitors
Teverovsky Evaluation of Polymer Hermetically Sealed Tantalum Capacitors
Teverovsky Effect of high temperature storage on AC characteristics of polymer tantalum capacitors
Teverovsky Evaluation of 10V chip polymer tantalum capacitors for space applications
Teverovsky Effect of mechanical stresses on characteristics of chip tantalum capacitors
Teverovsky Reliability Issues with Polymer and MnO2 Tantalum Capacitors for Space Applications
Teverovsky Effect of preconditioning and soldering on failures of chip tantalum capacitors
Hahn et al. Solid electrolytic capacitors designed for high temperature applications
Teverovsky Guidelines for Testing of Polymer Tantalum Capacitors
Virkki et al. Testing the effects of reflow on tantalum capacitors
Teverovsky Effect of temperature cycling and exposure to extreme temperatures on reliability of solid tantalum capacitors
WO1983003143A1 (en) Electrical testing
Dyson Improvements in Multilayer Ceramic Capacitors