Kolb, 1973 - Google Patents
Differential reflectance spectroscopy of monolayer and submonolayer metal deposits on semiconductor and metal electrodesKolb, 1973
- Document ID
- 4626868320784840015
- Author
- Kolb D
- Publication year
- Publication venue
- Faraday Discussions of the Chemical Society
External Links
Snippet
The deposition of metals in monolayer amounts onto semiconductor and metal electrode surfaces was studied by differential reflectance spectroscopy; results are reported for Zn on ZnO, Cd on CdS and Tl on ZnO and Au. The deposition was achieved from electrolytic …
- 229910052751 metal 0 title abstract description 34
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electro-chemical, or magnetic means
- G01N27/26—Investigating or analysing materials by the use of electric, electro-chemical, or magnetic means by investigating electrochemical variables; by using electrolysis or electrophoresis
- G01N27/416—Systems
- G01N27/42—Measuring disposition or liberation of materials from an electrolyte; Coulometry, i.e. measuring coulomb-equivalent of material in an electrolyte
- G01N27/423—Coulometry
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