Alsman et al., 2003 - Google Patents
Machine vision image analysis capability for image intensifier tubes and systemsAlsman et al., 2003
- Document ID
- 4534894052907613592
- Author
- Alsman D
- Paul C
- Sartor M
- Publication year
- Publication venue
- Low-Light-Level and Real-Time Imaging Systems, Components, and Applications
External Links
Snippet
The Image Intensifier Tube (IIT) is the most critical component within a night vision device. Acquisition, production, test and evaluation of image intensifier tubes can be greatly enhanced by the application of machine vision technology. The Navy, Air Force and Army …
- 238000010191 image analysis 0 title description 2
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/02—Testing of optical properties of lenses
- G01M11/0242—Testing of optical properties of lenses by measuring geometrical properties or aberrations
- G01M11/0257—Testing of optical properties of lenses by measuring geometrical properties or aberrations by analyzing the image formed by the object to be tested
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/02—Testing of optical properties of lenses
- G01M11/0292—Testing of optical properties of lenses of objectives by measuring the optical modulation transfer function
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical means
- G01B11/24—Measuring arrangements characterised by the use of optical means for measuring contours or curvatures
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume, or surface-area of porous materials
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/30—Subject of image; Context of image processing
- G06T2207/30108—Industrial image inspection
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry
- G01J5/02—Details
- G01J5/04—Casings Mountings
- G01J5/041—Mountings in enclosures or in a particular environment
- G01J5/043—Prevention or determination of dust, smog or clogging
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP5178079B2 (en) | Defect inspection method and apparatus | |
US5557097A (en) | Cytological system autofocus integrity checking apparatus | |
TWI436051B (en) | A pattern inspection apparatus, a pattern inspection method, and a recording medium in which a program is recorded | |
US9222897B2 (en) | Method for characterizing a feature on a mask and device for carrying out the method | |
US5841124A (en) | Cytological system autofocus integrity checking apparatus | |
CN107144420B (en) | Optical lens aberration detection device and method | |
CN107525651A (en) | Camera lens resolving power method of testing, apparatus and system | |
JP2004004073A (en) | Sensor position alignment method in 3-dimensional measuring system | |
CN209283391U (en) | The lens detecting device of distance element | |
Alsman et al. | Machine vision image analysis capability for image intensifier tubes and systems | |
US20140320672A1 (en) | Method and Apparatus for Measuring Flange Back Focus and Calibrating Track Length Scales of Photographic Objective Lenses | |
CN111610000B (en) | Method for measuring multiplying power chromatic aberration of star sensor optical system based on angle | |
JP6539812B1 (en) | Inspection method of lens | |
JP4828737B2 (en) | MTF measuring device | |
CN112197942A (en) | Method and system for analyzing imaging performance of ultra-precision machining optical micro-lens array | |
JP5325481B2 (en) | Measuring method of optical element and manufacturing method of optical element | |
CN206804276U (en) | A kind of test device based on modularity high accuracy microscopic system | |
CN105067626B (en) | A kind of image visibility measuring method of multiple reflections formula | |
Leonov | Features of the development of systems for measuring the quality characteristics of optical systems of the visible spectrum | |
CN116297337B (en) | Method for judging number of layers of two-dimensional material by using dark field optical imaging technology | |
CN111141494B (en) | Test method and test system | |
CN110873639B (en) | Optical detection device | |
CN112985777A (en) | Modulation transfer function test system and test method of EMCCD assembly | |
Gonzales et al. | Optical behavior simulation of the divergence adapter elements in a Ronchi deflectometry configuration for convex surfaces. | |
AU703182C (en) | Cytological system autofocus integrity checking apparatus |