[go: up one dir, main page]
More Web Proxy on the site http://driver.im/

Maheshwari et al., 2016 - Google Patents

Emission source microscopy technique for EMI source localization

Maheshwari et al., 2016

View PDF
Document ID
4501546909725978667
Author
Maheshwari P
Kajbaf H
Khilkevich V
Pommerenke D
Publication year
Publication venue
IEEE Transactions on Electromagnetic Compatibility

External Links

Snippet

For large, complex systems with multiple sources at the same frequency, localizing the sources of radiation often proves difficult. This paper presents an emission source microscopy (ESM) technique derived from synthetic aperture radar (SAR) to localize …
Continue reading at amberpi.com (PDF) (other versions)

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/08—Measuring electromagnetic field characteristics
    • G01R29/0807—Measuring electromagnetic field characteristics characterised by the application
    • G01R29/0814—Field measurements related to measuring influence on or from apparatus, components or humans, e.g. in ESD, EMI, EMC, EMP testing, measuring radiation leakage; detecting presence of micro- or radiowave emitters; dosimetry; testing shielding; measurements related to lightning
    • G01R29/0821—Field measurements related to measuring influence on or from apparatus, components or humans, e.g. in ESD, EMI, EMC, EMP testing, measuring radiation leakage; detecting presence of micro- or radiowave emitters; dosimetry; testing shielding; measurements related to lightning rooms and test sites therefor, e.g. anechoic chambers, open field sites or TEM cells
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/08—Measuring electromagnetic field characteristics
    • G01R29/10—Radiation diagrams of aerials; Antenna testing in general
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/08—Measuring electromagnetic field characteristics
    • G01R29/0864—Measuring electromagnetic field characteristics characterised by constructional or functional features
    • G01R29/0878—Sensors; antennas; probes; detectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/001—Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
    • G01R33/10—Plotting field distribution; Measuring field distribution
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/20—Arrangements or instruments for measuring magnetic variables involving magnetic resonance
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES

Similar Documents

Publication Publication Date Title
Maheshwari et al. Emission source microscopy technique for EMI source localization
Zhang et al. An effective method of probe calibration in phase-resolved near-field scanning for EMI application
Paris et al. Basic theory of probe-compensated near-field measurements
Piuzzi et al. Complex radar cross section measurements of the human body for breath-activity monitoring applications
Karami et al. Localization of electromagnetic interference sources using a time-reversal cavity
Zhang et al. Sparse emission source microscopy for rapid emission source imaging
Maheshwari et al. Application of emission source microscopy technique to EMI source localization above 5 GHz
Tamminen et al. Indirect holographic imaging at 310 GHz
Sørensen et al. Analysis of the effect on image quality of different scanning point selection methods in sparse ESM
Russer et al. Time-domain modeling of noisy electromagnetic field propagation
Li et al. Phase-resolved near-field scan over random fields
Alavi et al. Detection of the defective vias in SIW circuits from single/array probe (s) data using source reconstruction method and machine learning
Zhang et al. An EM imaging method based on plane-wave spectrum and transmission line model
Wang et al. Probe design and source reconstruction for near-field scanning and modeling
Knapp et al. Near-field antenna pattern measurements in highly reflective environments
Jiao et al. EMI mitigation with lossy material at 10 GHz
Salvade et al. A new microwave axial tomograph for the inspection of dielectric materials
Tian et al. Efficient and accurate measurement of absorption cross section of a lossy object in reverberation chamber using two one-antenna methods
Bozzetti et al. Shielding performance of an expanded copper foil over a wide frequency range
Lange et al. Investigation of the surface equivalence principle on a metal surface for a near-field to far-field transformation by the NFS3000
Lu et al. An innovative virtual chamber measurement method based on spatial domain cancellation technique for radiation emission in situ test
Schroeder et al. Broadband Far-Field Estimation of a Spherical Dipole Using Near-Field Scanning Data Up to 1 GHz
Gregson et al. Verification of spherical mathematical absorber reflection suppression in a combination spherical near-field and compact antenna test range
Derat et al. A novel technology for fast and accurate specific absorption rate measurement
See et al. An empirical approach to develop near-field limit for radiated-emission compliance check