Bruce et al., 1974 - Google Patents

Optical properties of thin chromium films

Bruce et al., 1974

Document ID: 4253822152477494545
Author: Bruce C; Clothier W
Publication year: 1974
Publication venue: Journal of the Optical Society of America

External Links

Cited by

Snippet

The optical properties of very-thin chromium films and their suitability for use in precision, scanning, reflection interferometry have been studied. The thickness range was from 0–36 nm. The reflectances and transmittances were measured with an absolute reflectometer. The …

Continue reading at opg.optica.org (HTML) (other versions)

230000003287 optical 0 title abstract description 38

Classifications

- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
- G02B5/00—Optical elements other than lenses
- G02B5/30—Polarising elements
- G—PHYSICS
- G02—OPTICS
- G02F—DEVICES OR ARRANGEMENTS, THE OPTICAL OPERATION OF WHICH IS MODIFIED BY CHANGING THE OPTICAL PROPERTIES OF THE MEDIUM OF THE DEVICES OR ARRANGEMENTS FOR THE CONTROL OF THE INTENSITY, COLOUR, PHASE, POLARISATION OR DIRECTION OF LIGHT, e.g. SWITCHING, GATING, MODULATING OR DEMODULATING; TECHNIQUES OR PROCEDURES FOR THE OPERATION THEREOF; FREQUENCY-CHANGING; NON-LINEAR OPTICS; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating, or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating, or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
- G02B6/00—Light guides
- G02B6/10—Light guides of the optical waveguide type
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/41—Refractivity; Phase-affecting properties, e.g. optical path length
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
- G02B1/00—Optical elements characterised by the material of which they are made
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
- G02B27/00—Other optical systems; Other optical apparatus
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
- G02B26/00—Optical devices or arrangements using movable or deformable optical elements for controlling the intensity, colour, phase, polarisation or direction of light, e.g. switching, gating, modulating
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
- G02B21/00—Microscopes

Similar Documents

Publication	Publication Date	Title
Yamamoto et al.	1992	In situ ellipsometric study of optical properties of ultrathin films
Ennos	1966	Stresses developed in optical film coatings
Bennett et al.	1970	Optical constants of silver sulfide tarnish films
Schulz	1954	The optical constants of silver, gold, copper, and aluminum. I. The absorption coefficient k
Pond et al.	1989	Stress reduction in ion beam sputtered mixed oxide films
Carniglia et al.	1971	Phase-shift measurement of evanescent electromagnetic waves
Stanford	1970	Determination of surface-film thickness from shift of optically excited surface plasma resonance
Koehler et al.	1959	Optical constants of evaporated selenium films by successive approximations
Schulz	1957	Experimental study of the optical properties of liquid Hg and liquid Ga in the wavelength range of 0.23 μ to 13 μ
Berreman et al.	1977	Doubly curved crystal point-focusing x-ray monochromators: geometrical and practical optics
Bruce et al.	1974	Optical properties of thin chromium films
Boeckner	1929	A method of obtaining the optical constants of metallically reflecting substances in the infrared
Bennett et al.	1969	Validity of ellipsometry for determining the average thickness of thin, discontinuous, absorbing films
Schulz	1951	An interferometric method for the determination of the absorption coefficients of metals, with results for silver and aluminum
Rank et al.	1955	Problem of phase variation with wavelength in dielectric films. Extension of interferometric standards into the infrared
Dyson	1963	Very stable common-path interferometers and applications
Rudisill et al.	1974	Optical coatings for high energy ZnSe laser windows
Koehler	1953	Multiple-Beam Fringes of Equal Chromatic Order. Part I. Phase Change Considerations
Pluta	1987	Object-adapted variable-wavelength interferometry. I. Theoretical basis
Mertens et al.	1963	Some observations on the use of elliptically polarized light to study metal surfaces
Traub et al.	1957	Brewster angle apparatus for thin film index measurements
Schulz et al.	1950	An experimental study of the change in phase accompanying reflection of light from thin evaporated films
Holden	1951	The Shape of Reflected Interference Fringes from Interferometers Coated with Thin Metal Films
Stone et al.	1978	Optical fiber refractometry by interference microscopy: a simplified method
Nassif	1997	Accurate measurement of refraction and dispersion of a solid by a double-layer interferometer