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Error reduction of SRAM-based physically unclonable function for chip authentication

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Abstract

SRAM-based physically unclonable function (PUF) is an attractive security primitive for cryptographic protocol and security architecture because SRAM itself is one of the most widely used embedded memories. In terms of robustness, however, there is a weakness for SRAM PUF owing to a bit error; thus, a method must be explored to reduce this error. In this work, a novel hardware chip to characterize cell-to-cell entropy is demonstrated for robust SRAM based PUF by implementation of a screening test to filter out poor cells. We design a chip with a power controller, circuits for error correction coding, a SRAM array and central processing unit. Then it was fabricated by a foundry service. We also propose a procedure to suppress the bit error by use of a screening test, which is based on SRAM cells possessing their own entropy. Through the screening test, the bit error rate (BER) is reduced to below \({10}^{-6}\), which is much smaller than the BER of 0.05 in previous reports, i.e., the robustness is notably improved. Moreover, this robustness was evaluated in terms of an error correction code (ECC) failure rate and temperature after the screening test. SRAM-based PUF with enhanced robustness can contribute to implementing a security protocol and architecture for chip authentication.

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Data availability statments

The datasets generated during and/or analyzed during the current study are available from the corresponding author on reasonable request.

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Acknowledgements

This work was supported in part by the National Research Foundation (NRF) of the Republic of Korea, under Grant 2018R1A2A3075302 and Grant 2020M3F3A2A01082592, and in part by the Soonchunhyang University Research Fund.

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Authors and Affiliations

  1. School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), 291 Daehak-ro, Yuseong-gu, Daejeon, 34141, Republic of Korea

    Moon-Seok Kim, Ji-Man Yu, Il-Woong Tcho & Yang-Kyu Choi

  2. The attached Institute of ETRI, Yuseong-gu, Daejeon, 34141, Republic of Korea

    Moon-Seok Kim, Sang-Kyung Yoo & Bong-Soo Lee

  3. Department of Electronic Engineering, Soonchunhyang University, Asan, 31538, Republic of Korea

    Moon-Seok Kim

  4. Department of Electrical Engineering and Convergence Engineering for Intelligent Drone, Sejong University, Seoul, 05006, Republic of Korea

    Sungho Kim

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Contributions

M-SK contributed to conceptualization, methodology, investigation, and main manuscript text. SK contributed to software development. S-KY contributed to formal analysis and visualization. B-SL contributed to ASIC development. J-MY contributed to data curation. I-WTS contributed to methodology. Y-KC contributed to review and editing main manuscript and project administration. All authors reviewed manuscript.

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Correspondence to Yang-Kyu Choi.

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Kim, MS., Kim, S., Yoo, SK. et al. Error reduction of SRAM-based physically unclonable function for chip authentication. Int. J. Inf. Secur. 22, 1087–1098 (2023). https://doi.org/10.1007/s10207-023-00668-0

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