Abstract
In a recent paper [1] a scheme for reducing error masking probability by modifying the output data before compaction has been proposed. The aim of the present comment is to direct one's attention to another method of modifier construction. The method employs a linear combinational circuit (LCC) as modifier. Such an approach may require little extra hardware. Furthermore, there is an efficient algorithm for finding a modifier.
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References
Y. Zorian and V.K. Agarwal, “Optimizing error masking in BIST by output data modification,” Journal of Electronic Testing—Theory and Applications, 1 (1): 59–71, 1990.
V.K. Agarwal, “Increasing effectiveness of built-in testing by output data modification”, Proc. 13th Int. Symp. on Fault-Tolerant Computing (FTCS), pp. 227–234, June 1983.
R.Kh. Latypov, “Using Reed-Muller codes in circuit self-testing” Avtomatika i Telemekhanika (USSR), N 9: 145–151, 1986 (in Russian).
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A.K. Susskind, “Testing by verifying Walsh coefficients,” Proc. 11th Int. Symp. on Fault-Tolerant Computing (FTCS), pp. 206–208, June 1981.
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Latypov, R.K. Comments on “optimizing error masking in BIST by output data modification”. J Electron Test 2, 307–308 (1991). https://doi.org/10.1007/BF00135445
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DOI: https://doi.org/10.1007/BF00135445