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Pattern or Artifact? Interactively Exploring Embedding Quality with TRACE

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Machine Learning and Knowledge Discovery in Databases. Research Track and Demo Track (ECML PKDD 2024)

Abstract

This paper presents TRACE, a tool to analyze the quality of 2D embeddings generated through dimensionality reduction techniques. Dimensionality reduction methods often prioritize preserving either local neighborhoods or global distances, but insights from visual structures can be misleading if the objective has not been achieved uniformly. TRACE addresses this challenge by providing a scalable and extensible pipeline for computing both local and global quality measures. The interactive browser-based interface allows users to explore various embeddings while visually assessing the pointwise embedding quality. The interface also facilitates in-depth analysis by highlighting high-dimensional nearest neighbors for any group of points and displaying high-dimensional distances between points. TRACE enables analysts to make informed decisions regarding the most suitable dimensionality reduction method for their specific use case, by showing the degree and location where structure is preserved in the reduced space.

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References

  1. Chatzimparmpas, A., et al.: T-viSNE: interactive assessment and interpretation of t-SNE projections. IETVCG 26(8), 2696–2714 (2020)

    Google Scholar 

  2. Heulot, N. et al.: ProxiLens: interactive exploration of high-dimensional data using projections. In: VAMP: EuroVis Workshop on Visual Analytics using Multidimensional Projections. The Eurographics Association (2013)

    Google Scholar 

  3. Jeon, H. et al.: Zadu: A python library for evaluating the reliability of dimensionality reduction embeddings. In: 2023 IEEE VIS (2023)

    Google Scholar 

  4. Lee, J.A., Verleysen, M.: Quality assessment of dimensionality reduction: rank-based criteria. Neurocomputing 72(7–9), 1431–1443 (2009)

    Article  Google Scholar 

  5. Lekschas, F.: Regl-scatterplot: a scalable interactive JavaScript-based scatter plot library. J. Open Sour. Softw. 8(84), 5275 (2023)

    Article  Google Scholar 

  6. Lespinats, S., Aupetit, M.: CheckViz: sanity check and topological clues for linear and non-linear mappings. In: Computer Graphics Forum, vol. 30, pp. 113–125. Wiley Online Library (2011)

    Google Scholar 

  7. Sun, E.D., et al.: Dynamic visualization of high-dimensional data. Nat. Comput. Sci. 3(1), 86–100 (2023)

    Article  Google Scholar 

  8. Wang, Y., et al.: Understanding how dimension reduction tools work: an empirical approach to deciphering t-SNE, UMAP, TriMAP, and PaCMAP for data visualization. JMLR 22(1), 9129–9201 (2021)

    MathSciNet  Google Scholar 

  9. Zhang, Y., et al.: pyDRMetrics-a python toolkit for dimensionality reduction quality assessment. Heliyon 7(2), e06199 (2021)

    Article  MathSciNet  Google Scholar 

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Acknowledgements

This research was funded by the BOF of Ghent University (BOF20/IBF/117), the Flemish Government (AI Research Program), and the FWO (project no. G0F9816N, 3G042220, G073924N, 11J2322N).

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Correspondence to Edith Heiter .

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Heiter, E. et al. (2024). Pattern or Artifact? Interactively Exploring Embedding Quality with TRACE. In: Bifet, A., et al. Machine Learning and Knowledge Discovery in Databases. Research Track and Demo Track. ECML PKDD 2024. Lecture Notes in Computer Science(), vol 14948. Springer, Cham. https://doi.org/10.1007/978-3-031-70371-3_24

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  • DOI: https://doi.org/10.1007/978-3-031-70371-3_24

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  • Publisher Name: Springer, Cham

  • Print ISBN: 978-3-031-70370-6

  • Online ISBN: 978-3-031-70371-3

  • eBook Packages: Computer ScienceComputer Science (R0)

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