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- research-articleJanuary 2023
Trojan-D2: Post-Layout Design and Detection of Stealthy Hardware Trojans - A RISC-V Case Study
ASPDAC '23: Proceedings of the 28th Asia and South Pacific Design Automation ConferencePages 683–689https://doi.org/10.1145/3566097.3567919With the exponential increase in the popularity of the RISC-V ecosystem, the security of this platform must be re-evaluated especially for mission-critical and IoT devices. Besides, the insertion of a Hardware Trojan (HT) into a chip after the in-house ...
- research-articleJune 2021
CONCEALING-Gate: Optical Contactless Probing Resilient Design
- M. Tanjidur Rahman,
- Nusrat Farzana Dipu,
- Dhwani Mehta,
- Shahin Tajik,
- Mark Tehranipoor,
- Navid Asadizanjani
ACM Journal on Emerging Technologies in Computing Systems (JETC), Volume 17, Issue 3Article No.: 39, Pages 1–25https://doi.org/10.1145/3446998Optical probing, though developed as silicon debugging tools from the chip backside, has shown its capability of extracting secret data, such as cryptographic keys and user identifications, from modern system-on-chip devices. Existing optical probing ...
- ArticleAugust 2010
Flash memory 'bumping' attacks
CHES'10: Proceedings of the 12th international conference on Cryptographic hardware and embedded systemsPages 158–172This paper introduces a new class of optical fault injection attacks called bumping attacks. These attacks are aimed at data extraction from secure embedded memory, which usually stores critical parts of algorithms, sensitive data and cryptographic ...
- research-articleMay 2008
Physical Techniques for Chip-Backside IC Debug in Nanotechnologies
The prerequisite to physical analysis for IC functionality in nanoscale technologies is access through the chip backside. Based on typical global backside preparation with a moderate silicon thickness of 50 to 100 microns remaining, the authors of this ...
- ArticleOctober 2006
Optically enhanced position-locked power analysis
CHES'06: Proceedings of the 8th international conference on Cryptographic Hardware and Embedded SystemsPages 61–75https://doi.org/10.1007/11894063_6This paper introduces a refinement of the power-analysis attack on integrated circuits. By using a laser to illuminate a specific area on the chip surface, the current through an individual transistor can be made visible in the circuit’s power trace. ...
- ArticleDecember 2002
On a New Way to Read Data from Memory
This paper explains a new family of techniques to extract data from semiconductormemory, without using the read-out circuitryprovided for the purpose. What these techniques have in common is the use of semi-invasive probing methods to induce measurable ...