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10.1109/ISVLSI.2007.31guideproceedingsArticle/Chapter ViewAbstractPublication PagesConference Proceedingsacm-pubtype
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Code-coverage Based Test Vector Generation for SystemC Designs

Published: 09 March 2007 Publication History

Abstract

This work presents a methodology for the automatic test vector generation for SystemC combinational designs based on code coverage analysis which is complementary to the functional testing. The method uses coverage information to generate test vectors capable of covering the portions of code not exercised by the Black-box testing. Vectors are generated using an instrumented code followed by a numerical optimization method. This approach does not suffer from restrictions related to symbolic execution such as defining array reference values and loop boundaries, as the code is really executed together with the optimization. We expect this combined methodology to achieve total code coverage of the design and reduce the fault of omission problem, undetectable by Structural testing alone.

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  • (2017)A methodology to take credit for high-level verification during RTL verificationFormal Methods in System Design10.1007/s10703-017-0299-251:2(395-418)Online publication date: 1-Nov-2017
  • (2013)A HW/SW co-verification framework for SystemCACM Transactions on Embedded Computing Systems10.1145/2435227.243525712:1s(1-23)Online publication date: 29-Mar-2013

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cover image Guide Proceedings
ISVLSI '07: Proceedings of the IEEE Computer Society Annual Symposium on VLSI
March 2007
516 pages
ISBN:0769528961

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IEEE Computer Society

United States

Publication History

Published: 09 March 2007

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Cited By

View all
  • (2017)A methodology to take credit for high-level verification during RTL verificationFormal Methods in System Design10.1007/s10703-017-0299-251:2(395-418)Online publication date: 1-Nov-2017
  • (2013)A HW/SW co-verification framework for SystemCACM Transactions on Embedded Computing Systems10.1145/2435227.243525712:1s(1-23)Online publication date: 29-Mar-2013

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