research-article

Automatic Test Program Generation: A Case Study

Authors:

Fulvio Corno,

Ernesto Sánchez,

Matteo Sonza Reorda,

Giovanni SquilleroAuthors Info & Claims

IEEE Design & Test, Volume 21, Issue 2

Pages 102 - 109

https://doi.org/10.1109/MDT.2004.1277902

Published: 01 March 2004 Publication History

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Abstract

Comprehensive coverage measurement should guide an effective testbench generation approach. Today, feedback from coverage to test generation often requires manual work; it is desirable to implement a framework that automates this feedback process. The authors propose a genetic-algorithm-based evolution framework for testbench generation. It enables small test programs to evolve and effectively capture target corner cases based on the feedback from coverage measurement.

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Automatic Test Program Generation: A Case Study

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IEEE Design & Test Volume 21, Issue 2

March 2004

87 pages

ISSN:0740-7475

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IEEE Computer Society Press

Washington, DC, United States

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Published: 01 March 2004

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Cheng SJin PGuo QDu ZZhang RHu XZhao YHao YGuan XHan HZhao ZLiu XZhang XChu YMao WChen TChen YLarson K(2024)Automated CPU design by learning from input-output examplesProceedings of the Thirty-Third International Joint Conference on Artificial Intelligence10.24963/ijcai.2024/425(3843-3853)Online publication date: 3-Aug-2024
https://dl.acm.org/doi/10.24963/ijcai.2024/425
Solt FJattke PRazavi KHardavellas NCampanoni SGrot BKarpuzcu U(2022)RemembERR: Leveraging Microprocessor Errata for Design Testing and ValidationProceedings of the 55th Annual IEEE/ACM International Symposium on Microarchitecture10.1109/MICRO56248.2022.00081(1126-1143)Online publication date: 1-Oct-2022
https://dl.acm.org/doi/10.1109/MICRO56248.2022.00081
Gabor TSedlmeier AKiermeier MPhan THenrich MPichlmair MKempter BKlein CSauer HAG RWieghardt JAuger AStützle T(2019)Scenario co-evolution for reinforcement learning on a grid world smart factory domainProceedings of the Genetic and Evolutionary Computation Conference10.1145/3321707.3321831(898-906)Online publication date: 13-Jul-2019
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Suryasarman VBiswas SSahu A(2019)RSBST: an Accelerated Automated Software-Based Self-Test Synthesis for Processor TestingJournal of Electronic Testing: Theory and Applications10.1007/s10836-019-05825-935:5(695-714)Online publication date: 1-Oct-2019
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Suryasarman VBiswas SSahu A(2018)Automation of Test Program Synthesis for Processor Post-silicon ValidationJournal of Electronic Testing: Theory and Applications10.1007/s10836-018-5709-x34:1(83-103)Online publication date: 1-Feb-2018
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Lin CChen C(2017)A Processor and Cache Online Self-Testing Methodology for OS-Managed PlatformIEEE Transactions on Very Large Scale Integration (VLSI) Systems10.1109/TVLSI.2017.269850625:8(2346-2359)Online publication date: 24-Jul-2017
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Riefert ACantoro RSauer MSonza Reorda MBecker B(2016)A Flexible Framework for the Automatic Generation of SBST ProgramsIEEE Transactions on Very Large Scale Integration (VLSI) Systems10.1109/TVLSI.2016.253880024:10(3055-3066)Online publication date: 1-Oct-2016
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Reimann FGlaß MTeich JCook AGómez LUll DWunderlich HEngelke PAbelein U(2014)Advanced DiagnosisProceedings of the 51st Annual Design Automation Conference10.1145/2593069.2602971(1-9)Online publication date: 1-Jun-2014
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Wu JJiang GShen YLam SSun JSrikanthan T(2014)Parallel reconfiguration algorithms for mesh-connected processor arraysThe Journal of Supercomputing10.1007/s11227-014-1096-y69:2(610-628)Online publication date: 1-Aug-2014
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Abstract

References

Cited By

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