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Testing Biquad Filters under Parametric Shifts Using X-Y Zoning

Authors:

J. FiguerasAuthors Info & Claims

Journal of Electronic Testing: Theory and Applications, Volume 21, Issue 3

Pages 257 - 265

https://doi.org/10.1007/s10836-005-6355-7

Published: 01 June 2005 Publication History

Abstract

Testing mixed-signal circuits is a difficult task due to defect modeling challenges, observability and controllability restrictions and ATE bandwidth limitations. In this paper, the X-Y Zoning test of a Biquad filter is addressed to select the optimal excitation frequency and the best partition of the X-Y plane. Thus we obtain the best sensitivity of the BIST scheme to parametric shifts of the parameters defining the filter. The study has been particularized to shifts in the natural frequency f ₀ of the Biquad filter. Analytical results on the best input as well as the best partition of the observed X-Y Lissajous plots are obtained. Extensive MATLAB simulations validate the proposal, which has also been validated experimentally. For these experiments, multiple implementations of the Biquad with nominal and shifted parameters have been performed using a commercial Field Programmable Analog Array (FPAA). The experimental measures show good correlation with the analytical expressions and the simulations performed, and validate the proposed testing methodology.

References

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12. IEEE standard 114.4-1999: IEEE Standard for a Mixed-Signal Test Bus , Institute of Electrical and Electronic Engineers Inc, 1999.

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Digital Library

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15. L.S. Milor, "A Tutorial Introduction to Research on Analog and Mixed-Signal Circuit Testing," IEEE Transactions on Circuits and Systems--II: Analog and Digital Signal Processing , vol. 45, no. 10, pp. 1389-1407, 1998.

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18. R. Sanahuja, V. Barcons, L. Balado, and J. Figueras, "Z-Y Zoning BIST: An FPAA Experiment," IMSTW 2002 , pp. 237-243, 2002.

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19. R. Sanahuja, V. Barcons, L. Balado, and J. Figueras, "Testing Biquad Filters under Parametric Shifts Using X-Y Zonning," IMSTW 2003 , June 2003, pp. 283-288.

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Cited By

Vélez Ibarra MVodanovic GLaprovitta APeretti GRomero E(2025)In-field Built-in Self-Test for Detecting Incipient Faults in Analog Reconfigurable FiltersCircuits, Systems, and Signal Processing10.1007/s00034-024-02819-744:2(715-748)Online publication date: 1-Feb-2025
https://dl.acm.org/doi/10.1007/s00034-024-02819-7
Gómez ASanahuja RBalado LFigueras JDe Micheli GAl-Hashimi BMueller WMacii E(2010)Analog circuit test based on a digital signatureProceedings of the Conference on Design, Automation and Test in Europe10.5555/1870926.1871322(1641-1644)Online publication date: 8-Mar-2010
https://dl.acm.org/doi/10.5555/1870926.1871322
Balado LLupon EFigueras JRoca MIsern EPicos R(2009)Verifying functional specifications by regression techniques on Lissajous test signaturesIEEE Transactions on Circuits and Systems Part I: Regular Papers10.1109/TCSI.2008.200434256:4(754-762)Online publication date: 1-Apr-2009
https://dl.acm.org/doi/10.1109/TCSI.2008.2004342

Index Terms

Testing Biquad Filters under Parametric Shifts Using X-Y Zoning
1. Computing methodologies
  1. Modeling and simulation
2. Hardware
  1. Hardware test
  2. Robustness

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Published In

cover image Journal of Electronic Testing: Theory and Applications

Journal of Electronic Testing: Theory and Applications Volume 21, Issue 3

June 2005

133 pages

ISSN:0923-8174

Issue’s Table of Contents

Copyright © Copyright © 2005 Springer Science + Business Media, Inc.

Publisher

Kluwer Academic Publishers

United States

Publication History

Published: 01 June 2005

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Cited By

Vélez Ibarra MVodanovic GLaprovitta APeretti GRomero E(2025)In-field Built-in Self-Test for Detecting Incipient Faults in Analog Reconfigurable FiltersCircuits, Systems, and Signal Processing10.1007/s00034-024-02819-744:2(715-748)Online publication date: 1-Feb-2025
https://dl.acm.org/doi/10.1007/s00034-024-02819-7
Gómez ASanahuja RBalado LFigueras JDe Micheli GAl-Hashimi BMueller WMacii E(2010)Analog circuit test based on a digital signatureProceedings of the Conference on Design, Automation and Test in Europe10.5555/1870926.1871322(1641-1644)Online publication date: 8-Mar-2010
https://dl.acm.org/doi/10.5555/1870926.1871322
Balado LLupon EFigueras JRoca MIsern EPicos R(2009)Verifying functional specifications by regression techniques on Lissajous test signaturesIEEE Transactions on Circuits and Systems Part I: Regular Papers10.1109/TCSI.2008.200434256:4(754-762)Online publication date: 1-Apr-2009
https://dl.acm.org/doi/10.1109/TCSI.2008.2004342

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