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View all- Tze Wee Chen Choshu Ito Loh WWei Wang Mitra SDutton R(2007)Macro-Model for Post-Breakdown 90NM and 130NM Transistors and its Applications in Predicting Chip-Level Function Failure after ESD-CDM EventsProceedings of the 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual10.1109/RELPHY.2007.369872(78-85)Online publication date: 1-Apr-2007
- Tseng KKariat VGetreu IFix LLavagno L(2003)Static noise analysis with noise windowsProceedings of the 40th annual Design Automation Conference10.1145/775832.776049(864-868)Online publication date: 2-Jun-2003