Transistor Stuck-Open Fault Detection in Multilevel CMOS Circuits

It is shown that a test set based on two-pattern tests, which are designed to detect single stuck-open faults, can be found that detects all multiple stuck-open faults inside any CMOS gate in the circuit. The concept is extended to three-pattern tests, ...

In this paper, potential invalidation of stuck-open fault-detecting tests, derived by neglecting circuit delays and charge distribution in CMOS logic circuits, is studied. Several classes of circuits derived from sum of products and product of sums ...

CMOS combinational circuits exhibit sequential behavior in the presence of open faults, thus making it necessary to use two pattern tests. Two or multi-pattern sequences may fail to detect CMOS stuck-open faults in the presence of glitches. The ...