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Advanced Techniques for GA-based sequential ATPGs

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R. MoscaAuthors Info & Claims

EDTC '96: Proceedings of the 1996 European conference on Design and Test

Page 375

Published: 11 March 1996 Publication History

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Abstract

Genetic Algorithms have been recently investigated as an efficient approach to test generation for synchronous sequential circuits. In this paper we propose a set of techniques which significantly improves the performance of a previously proposed the GA-based ATPG algorithm: in particular, the new techniques enhance the capability of the algorithm in terms of test length minimization and fault excitation. We report some experimental results gathered with a prototypical tool and show that a well-tuned GA-based ATPG is generally superior to both symbolic and topological ones in terms of achieved Fault Coverage and required CPU time.

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Cited By

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Chodacki M(2018)Genetic algorithm as self-test path and circular self-test path design methodVietnam Journal of Computer Science10.1007/s40595-018-0121-05:3-4(263-278)Online publication date: 1-Sep-2018
https://dl.acm.org/doi/10.1007/s40595-018-0121-0
Keim MDrechsler NDrechsler RBecker B(2001)Combining GAs and Symbolic Methods for High Quality Tests of Sequential CircuitsJournal of Electronic Testing: Theory and Applications10.1023/A:101119372582417:1(37-51)Online publication date: 1-Feb-2001
https://dl.acm.org/doi/10.1023/A%3A1011193725824
Pomeranz IReddy SSentovich E(2000)Simulation based test generation for scan designsProceedings of the 2000 IEEE/ACM international conference on Computer-aided design10.5555/602902.603024(544-549)Online publication date: 5-Nov-2000
https://dl.acm.org/doi/10.5555/602902.603024
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Advanced Techniques for GA-based sequential ATPGs
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Published In

EDTC '96: Proceedings of the 1996 European conference on Design and Test

March 1996

585 pages

ISBN:0818674237

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IEEE Computer Society

United States

Publication History

Published: 11 March 1996

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EDTC96

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SIGDA

EDTC96: European Design and Test Conference

March 11 - 14, 1996

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Cited By

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Chodacki M(2018)Genetic algorithm as self-test path and circular self-test path design methodVietnam Journal of Computer Science10.1007/s40595-018-0121-05:3-4(263-278)Online publication date: 1-Sep-2018
https://dl.acm.org/doi/10.1007/s40595-018-0121-0
Keim MDrechsler NDrechsler RBecker B(2001)Combining GAs and Symbolic Methods for High Quality Tests of Sequential CircuitsJournal of Electronic Testing: Theory and Applications10.1023/A:101119372582417:1(37-51)Online publication date: 1-Feb-2001
https://dl.acm.org/doi/10.1023/A%3A1011193725824
Pomeranz IReddy SSentovich E(2000)Simulation based test generation for scan designsProceedings of the 2000 IEEE/ACM international conference on Computer-aided design10.5555/602902.603024(544-549)Online publication date: 5-Nov-2000
https://dl.acm.org/doi/10.5555/602902.603024
(2000)Sensitivity Levels of Test Patterns and Their Usefulness in Simulation-Based Test GenerationProceedings of the 2000 IEEE International Conference on Computer Design: VLSI in Computers & Processors10.5555/557517.846890Online publication date: 17-Sep-2000
https://dl.acm.org/doi/10.5555/557517.846890
Pomeranz IReddy S(1999)A Cone-Based Genetic Optimization Procedure for Test Generation and Its Application to n$n$-Detections in Combinational CircuitsIEEE Transactions on Computers10.1109/12.80516448:10(1145-1152)Online publication date: 1-Oct-1999
https://dl.acm.org/doi/10.1109/12.805164
Becker BKeim MKrieger R(1999)Hybrid Fault Simulation for Synchronous Sequential CircuitsJournal of Electronic Testing: Theory and Applications10.1023/A:100837652245115:3(219-238)Online publication date: 1-Dec-1999
https://dl.acm.org/doi/10.1023/A%3A1008376522451
Pomeranz IReddy S(1997)On improving genetic optimization based test generationProceedings of the 1997 European conference on Design and Test10.5555/787260.787713Online publication date: 17-Mar-1997
https://dl.acm.org/doi/10.5555/787260.787713
Corno Fprinetto PRebaudenpgo MReorda M(1997)SAARAProceedings of the 1997 ACM symposium on Applied computing10.1145/331697.331745(228-232)Online publication date: 1-Apr-1997
https://dl.acm.org/doi/10.1145/331697.331745

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