The research reported in this paper was conducted to identify those attributes, of both sequential circuits and structural, sequential automatic test pattern generation (ATPG) algorithms, which can lead to extremely high test generation times. The ...
The feasibility of generating high quality functional test vectors for sequential circuits using the Growth (G) and Disappearance (D) fault model has been demonstrated earlier. In this paper we provide a theoretical validation of the G and D fault model ...
Introduced is a self-driven test point structure which permits at-speed, on-chip, non-scan, sequential testing using parallel pseudorandom test patterns applied only to the primary inputs of the circuit under test. The test network is unique in that ...
IEEE Computer Society
United States
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