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- Balakrishnan KTouba N(2006)Improving linear test data compressionIEEE Transactions on Very Large Scale Integration (VLSI) Systems10.1109/TVLSI.2006.88641714:11(1227-1237)Online publication date: 1-Nov-2006
- Novák OPlíva ZNosek JHlawiczka AGarbolino TGucwa K(2004)Test-Per-Clock Logic BIST with Semi-Deterministic Test Patterns and Zero-Aliasing CompactorJournal of Electronic Testing: Theory and Applications10.1023/B:JETT.0000009317.31947.c820:1(109-122)Online publication date: 1-Feb-2004
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