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STL—a high level language for simulation and test

Published: 02 July 1986 Publication History

Abstract

A high-level language for the description of functional tests is described. This language integrates simulation and test by providing a common source language and programming environment. Through the use of individual code generation modules, this high-level language can be compiled into input for various simulators and testers. “Expert knowledge” contained within each code generation module allows optimal test programs to be generated. In particular, the hardware architecture of the target tester is directly supported. The Simulation and Test Language (STL) programming environment also supports behavioral modeling of the device being designed. The outputs predicted by this behavioral model can then be automatically compared with the results produced by simulation.

References

[1]
"IL Reference Manual", SDA Systems.
[2]
G. Wood and H.F.S. Law, "SKILL- An Interactive Procedural Design Environment", 1986 IEEE Custom Integrated Circuit Conference.
[3]
"FACTOR Programming Manual", Sentry Digital Test Systems.
[4]
"CenRad Tester Language Manual", CenRad Semiconductor Test, Inc.
[5]
R. Hickling, "Tester Independent Problem Representation and Tester Dependent Program Generation", 1983 IEEE International Test Conference, pp. 476- 482.
[6]
R.W. Allen, C.D. Chert, M.M. Ervin-Willis, K.R. Rahlfs, R.E. Tullos, and S.L. Wu, "DORA : A System of CAD Post-Processors Providing Test Programs and Automatic Diagnostics Data for Digital Device and Board Manufacture", 1981 IEEE International Test Conference, pp. 555- 560.
[7]
B. Snoulten and J. Peacock, "ANGEL- Algorithmic Pattern Generator System", 1981 IEEE International Test Conference, pp. 484- 488.
[8]
I.M. Watson, J.A. Newkirk, R. Mathews, and D.B. Boyle, e'ICTEST : A Unified System for Functional Testing and Simulation of Digital iCs", 1982 IEEE International Test Conference, pp. 499-502.
[9]
K-W Lai, "Test Program Compiler- A High Level Test Program Specification Language", 1983 IEEE International Conference on Computer-Aided Design, pp. 30- 31.

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Published In

cover image ACM Conferences
DAC '86: Proceedings of the 23rd ACM/IEEE Design Automation Conference
July 1986
835 pages
ISBN:0818607025
  • Chairman:
  • Don Thomas

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IEEE Press

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Published: 02 July 1986

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DAC '86 Paper Acceptance Rate 124 of 300 submissions, 41%;
Overall Acceptance Rate 1,770 of 5,499 submissions, 32%

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