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Capacity analysis of automated material handling systems in semiconductor fabs

Published: 05 December 2004 Publication History

Abstract

A critical aspect of semiconductor manufacturing is the design and analysis of material handling and production control polices to optimize fab performance. As wafer sizes have increased, semiconductor fabs have moved toward the use of automated material handling systems (AMHS). However, the behavior of AMHS and the effects of AMHS on fab productivity is not well understood. This research involves the development of a design and analysis methodology for evaluating the throughput capacity of AMHS. A set of simulation experiments is used to evaluate the throughput capacity of an AMHS and the effects on fab performance measures. The analysis uses SEMATECH fab data for full semiconductor fabs to evaluate the AMHS throughput capacity.

References

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Bahaji, N. and M. E. Kuhl. 2004. A Simulation Study of Composite Dispatching Rules, CONWIP and Push Lot Release in Semiconductor Fabrication, Submitted to IEEE Transactions on Semiconductor Manufacturing.
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Campbell, R. L., D. Rohan, and E. A. MacNair. 1999. A Model of a 300mm Wafer Fabrication Line, In Proceedings of the 1999 Winter Simulation Conference, eds. P. Farrington, H. Nembhard, D. Sturrock, and G. Evans, Piscataway, NJ: IEEE, pp. 909--911.
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Hunter, R., and C. Humphreys. 2004. Trends in 300mm Factory Automation, Reed-Business Information. Available at <www.reed-electronics.com> {Accessed July 15, 2004}.
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Inoue, T. 2002. A Comparison of AMHS Delivery Models in the Fab of the Future, Future Fab International. Available at <www.future-fab.com> {Accessed July 15, 2004}.
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Kuhl, M. E. and G. R. Laubisch. 2004. A Simulation Study of Dispatching Rules and Rework Strategies in Semiconductor Manufacturing, To Appear, Proceedings of the 15th Annual IEEE/SEMI Advanced Semiconductor Manufacturing Conference.
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Kuhl, M. E., K. D. Hirschman, G. R. Laubisch, and V. Ramamurthi. 2004. Capacity and Productivity Modeling for Research and Development Laboratories Using a Representative Product Load, To Appear, Proceedings of the 15th Annual IEEE/SEMI Advanced Semiconductor Manufacturing Conference.
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Lin, J. T., F. K. Wang, and C. K. Wu. 2003. Simulation Analysis of Connecting Transport AMHS in a Wafer Fab, IEEE Transactions on Semiconductor Manufacturing, 16(3), 555--564.
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Mackulak, G. and P Savory. 2001. A Simulation-Based Experiment for Comparing AMHS Performance in a Semiconductor Fabrication Facility, IEEE Transactions on Semiconductor Manufacturing, 14(3); pp. 273--280.
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Murray, S., G. T. Mackulak, J. W. Fowler, and T. Covlin. 2000. A Simulation-Based Cost Modeling Methodology for Evaluation of Interbay Material Handling in a Semiconductor Wafer Fab, In, The Proceeding of the 2000 Winter Simulation Conference, Piscataway, NJ: IEEE, pp. 1510--1518.
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NSF/SRC. 2004. FORCeII Solicitation -- Research Needs Document, NSF/SRC/SEMATECH, NSF-RFP 04--532, National Science Foundation. Available at <http://ww.nsf.gov> {Accessed July 15, 2004}.
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Papronty, I., J. Y. Shiau, Y. Huh, and G. Mackulak. 2000. Simulation Based Comparison of AMHS Alternatives: Continuous Flow vs. Overhead Monorail, In Proceedings of the 2000 Winter Simulation Conference, eds. J. Joines, R. Barton, K. Kang, and P. Fishwick, Piscataway, NJ: IEEE, pp. 1333--1338.

Cited By

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  • (2013)Automated planning, execution and evaluation of simulation experiments of semiconductor AMHSProceedings of the 2013 Winter Simulation Conference: Simulation: Making Decisions in a Complex World10.5555/2675983.2675880(3891-3904)Online publication date: 8-Dec-2013
  • (2007)Reusable tool for 300mm intrabay AMHS modeling and simulationProceedings of the 39th conference on Winter simulation: 40 years! The best is yet to come10.5555/1351542.1351863(1789-1797)Online publication date: 9-Dec-2007
  • (2007)Survey of research in modeling conveyor-based automated material handling systems in wafer fabsProceedings of the 39th conference on Winter simulation: 40 years! The best is yet to come10.5555/1351542.1351862(1781-1788)Online publication date: 9-Dec-2007
  1. Capacity analysis of automated material handling systems in semiconductor fabs

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    cover image ACM Conferences
    WSC '04: Proceedings of the 36th conference on Winter simulation
    December 2004
    2052 pages
    ISBN:0780387864

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    Winter Simulation Conference

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    Published: 05 December 2004

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    WSC '04 Paper Acceptance Rate 144 of 171 submissions, 84%;
    Overall Acceptance Rate 3,413 of 5,075 submissions, 67%

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    • (2013)Automated planning, execution and evaluation of simulation experiments of semiconductor AMHSProceedings of the 2013 Winter Simulation Conference: Simulation: Making Decisions in a Complex World10.5555/2675983.2675880(3891-3904)Online publication date: 8-Dec-2013
    • (2007)Reusable tool for 300mm intrabay AMHS modeling and simulationProceedings of the 39th conference on Winter simulation: 40 years! The best is yet to come10.5555/1351542.1351863(1789-1797)Online publication date: 9-Dec-2007
    • (2007)Survey of research in modeling conveyor-based automated material handling systems in wafer fabsProceedings of the 39th conference on Winter simulation: 40 years! The best is yet to come10.5555/1351542.1351862(1781-1788)Online publication date: 9-Dec-2007

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