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research-article

A diagnosis algorithm for extreme space compaction

Authors:

Hans-Joachim WunderlichAuthors Info & Claims

DATE '09: Proceedings of the Conference on Design, Automation and Test in Europe

Pages 1355 - 1360

Published: 20 April 2009 Publication History

Abstract

During volume testing, test application time, test data volume and high performance automatic test equipment (ATE) are the major cost factors. Embedded testing including built-in self-test (BIST) and multi-site testing are quite effective cost reduction techniques which may make diagnosis more complex. This paper presents a test response compaction scheme and a corresponding diagnosis algorithm which are especially suited for BIST and multi-site testing. The experimental results on industrial designs show, that test time and response data volume reduces significantly and the diagnostic resolution even improves with this scheme. A comparison with X-Compact indicates, that simple parity information provides higher diagnostic resolution per response data bit than more complex signatures.

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Cited By

Tille DGottinger BPfannkuchen UGraeb HSchlichtmann UShin Y(2018)On enabling diagnosis for 1-pin test fails in an industrial flowProceedings of the 23rd Asia and South Pacific Design Automation Conference10.5555/3201607.3201656(233-238)Online publication date: 22-Jan-2018
https://dl.acm.org/doi/10.5555/3201607.3201656
Howard JReddy SPomeranz IBecker B(2011)Fault diagnosis aware ATE assisted test response compactionProceedings of the 16th Asia and South Pacific Design Automation Conference10.5555/1950815.1950969(812-817)Online publication date: 25-Jan-2011
https://dl.acm.org/doi/10.5555/1950815.1950969
Elm MWunderlich HDe Micheli GAl-Hashimi BMueller WMacii E(2010)BISDProceedings of the Conference on Design, Automation and Test in Europe10.5555/1870926.1871225(1243-1248)Online publication date: 8-Mar-2010
https://dl.acm.org/doi/10.5555/1870926.1871225

A diagnosis algorithm for extreme space compaction
1. Hardware

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Information & Contributors

Information

Published In

cover image ACM Conferences

DATE '09: Proceedings of the Conference on Design, Automation and Test in Europe

April 2009

1776 pages

ISBN:9783981080155

General Chairs:
Luca Benini
University of Bologna, IT
,
Giovanni De Micheli
EPFL, CH
,
Program Chairs:
Bashir Al-Hashimi
University of Southampton, UK
,
Wolfgang Mueller
University of Paderborn, DE

Sponsors

EDAA: European Design Automation Association
ECSI
EDAC: Electronic Design Automation Consortium
SIGDA: ACM Special Interest Group on Design Automation
The IEEE Computer Society TTTC
The IEEE Computer Society DATC
The Russian Academy of Sciences: The Russian Academy of Sciences

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European Design and Automation Association

Leuven, Belgium

Publication History

Published: 20 April 2009

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DATE '09

Sponsor:

EDAA
EDAC
SIGDA
The Russian Academy of Sciences

DATE '09: Design, Automation and Test in Europe

April 20 - 24, 2009

Nice, France

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Overall Acceptance Rate 518 of 1,794 submissions, 29%

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Cited By

Tille DGottinger BPfannkuchen UGraeb HSchlichtmann UShin Y(2018)On enabling diagnosis for 1-pin test fails in an industrial flowProceedings of the 23rd Asia and South Pacific Design Automation Conference10.5555/3201607.3201656(233-238)Online publication date: 22-Jan-2018
https://dl.acm.org/doi/10.5555/3201607.3201656
Howard JReddy SPomeranz IBecker B(2011)Fault diagnosis aware ATE assisted test response compactionProceedings of the 16th Asia and South Pacific Design Automation Conference10.5555/1950815.1950969(812-817)Online publication date: 25-Jan-2011
https://dl.acm.org/doi/10.5555/1950815.1950969
Elm MWunderlich HDe Micheli GAl-Hashimi BMueller WMacii E(2010)BISDProceedings of the Conference on Design, Automation and Test in Europe10.5555/1870926.1871225(1243-1248)Online publication date: 8-Mar-2010
https://dl.acm.org/doi/10.5555/1870926.1871225

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