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- research-articleDecember 2024
Reliable and Timely Short-Packet Communications in Joint Communication and Over-the-Air Computation Offloading Systems: Analysis and Optimization
International Journal of Intelligent Systems (IJIS), Volume 2024https://doi.org/10.1155/2024/1168004This paper addressed the trade-off between timeliness and reliability in joint communication and over-the-air computation offloading (JCACO) system under short-packet communications (SPCs). The inevitable decoding errors introduced by SPC lead to errors ...
- research-articleMarch 2022
Universal Hot Carrier Degradation Model under DC and AC Stresses
2022 IEEE International Reliability Physics Symposium (IRPS)Pages 7A.1-1–7A.1-6https://doi.org/10.1109/IRPS48227.2022.9764580In this study, the impact of the self-heating effect (SHE) on the activation energy of hot-carrier injection (HCI) has been studied in n-FinFETs by correcting the channel temperature under different stress patterns. We also experimentally investigated why ...
- research-articleMarch 2022
Degradation Behaviors of 22 nm FDSOI CMOS Inverter Under Gigahertz AC Stress
2022 IEEE International Reliability Physics Symposium (IRPS)Pages P50-1–P50-5https://doi.org/10.1109/IRPS48227.2022.9764559In this work, Gigahertz (GHz) AC signals are stressed at the input terminal of 22 nm FDSOI inverters and the degradation behaviors of transistors in the inverter are found to be different from that under the single device stress. These transistors work ...
- research-articleMarch 2021
Nanosecond-scale and self-heating free characterization of advanced CMOS transistors utilizing wave reflection
2021 IEEE International Reliability Physics Symposium (IRPS)Pages 1–5https://doi.org/10.1109/IRPS46558.2021.9405218We demonstrate a novel nanosecond scale electrical characterization technique utilizing the natural reflection of alternating current (AC) signals for MOSFETs characterizations. With this approach, the Joule heating effect is negligible and the test-...