Article

Noise propagation and failure criteria for VLSI designs

Authors:

C. Oh,

R. LevyAuthors Info & Claims

ICCAD '02: Proceedings of the 2002 IEEE/ACM international conference on Computer-aided design

Pages 587 - 594

https://doi.org/10.1145/774572.774659

Published: 10 November 2002 Publication History

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Abstract

Noise analysis has become a critical concern in advanced chip designs. Traditional methods suffer from two common issues. First, noise that is propagated through the driver of a net is combined with noise injected by capacitively coupled aggressor nets using linear summation. Since this ignores the non-linear behavior of the driver gate the noise that develops on a net can be significantly underestimated. We therefore propose a new linear model that accurately combines propagated and injected noise on a net and which maintains the efficiency of linear simulation. After the propagated and injected noise are correctly combined on a victim net, it is necessary to determine if the noise can result in a functional failure. This is the second issue that we discuss in this paper. Traditionally, noise failure criteria have been based on unity gain points of the DC or AC transfer curves. However, we will show that for digital designs, these approaches can result in a pessimistic analysis in some cases, while in other cases, they allow circuit operation that is extremely close to regions that are unstable and do not allow sufficient margin for error in the analysis. In this paper, we compare the effectiveness of the discussed noise failure criteria and also present a propagation based method, which is intended to overcome these drawbacks. The proposed methods were implemented in a noise analysis tool and we demonstrate results on industrial circuits.

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Zhang JBobba SPatil NLin AWong HDe Micheli GMitra SSapatnekar S(2010)Carbon nanotube correlationProceedings of the 47th Design Automation Conference10.1145/1837274.1837497(889-892)Online publication date: 13-Jun-2010
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Champac VAvendaño VFigueras J(2010)Built-in sensor for signal integrity faults in digital interconnect signalsIEEE Transactions on Very Large Scale Integration (VLSI) Systems10.1109/TVLSI.2008.201039818:2(256-269)Online publication date: 1-Feb-2010
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Index Terms

Noise propagation and failure criteria for VLSI designs
1. Hardware

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Published In

ICCAD '02: Proceedings of the 2002 IEEE/ACM international conference on Computer-aided design

November 2002

793 pages

ISBN:0780376072

DOI:10.1145/774572

General Chair:
Lawrence T. Pileggi
Carnegie Mellon Univ., Pittsburgh, PA
,
Program Chair:
Andreas Kuehlmann
Cadence Berkeley Labs., Berkeley, CA

Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

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Association for Computing Machinery

New York, NY, United States

Publication History

Published: 10 November 2002

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ICCAD02: 2002 IEEE / ACM International Conference on Computer Aided Design

November 10 - 14, 2002

California, San Jose

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Cited By

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Zhang JBobba SPatil NLin AWong HDe Micheli GMitra SSapatnekar S(2010)Carbon nanotube correlationProceedings of the 47th Design Automation Conference10.1145/1837274.1837497(889-892)Online publication date: 13-Jun-2010
https://dl.acm.org/doi/10.1145/1837274.1837497
Champac VAvendaño VFigueras J(2010)Built-in sensor for signal integrity faults in digital interconnect signalsIEEE Transactions on Very Large Scale Integration (VLSI) Systems10.1109/TVLSI.2008.201039818:2(256-269)Online publication date: 1-Feb-2010
https://dl.acm.org/doi/10.1109/TVLSI.2008.2010398
Zhang JPatil NMitra S(2009)Probabilistic analysis and design of metallic-carbon-nanotube-tolerant digital logic circuitsIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.2009.202319728:9(1307-1320)Online publication date: 1-Sep-2009
https://dl.acm.org/doi/10.1109/TCAD.2009.2023197
Xu JRoy AChowdhury M(2008)Noise separation in analog integrated circuits using independent component analysis techniqueIntegrated Computer-Aided Engineering10.5555/1367166.136717115:2(163-180)Online publication date: 1-Apr-2008
https://dl.acm.org/doi/10.5555/1367166.1367171
Xu JNigam VRoy AChowdhury M(2008)Compound noise separation in digital circuits using blind source separationMicroelectronics Journal10.1016/j.mejo.2008.01.07039:8(1083-1092)Online publication date: Aug-2008
https://doi.org/10.1016/j.mejo.2008.01.070
Shrivastava SPratap RParameswaran HVerma MHirose F(2006)Crosstalk analysis using reconvergence correlationProceedings of the 2006 Asia and South Pacific Design Automation Conference10.1145/1118299.1118318(79-83)Online publication date: 24-Jan-2006
https://dl.acm.org/doi/10.1145/1118299.1118318
Oh NDing LKasnavi A(2006)Fast Sequential Cell Noise Immunity Characterization Using Meta-stable Point of Feedback LoopProceedings of the 7th International Symposium on Quality Electronic Design10.1109/ISQED.2006.67(153-159)Online publication date: 27-Mar-2006
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Zejda JDing L(2006)TBNM - Transistor-Level Boundary Model for Fast Gate-Level Noise Analysis of Macro BlocksProceedings of the 7th International Symposium on Quality Electronic Design10.1109/ISQED.2006.131(147-152)Online publication date: 27-Mar-2006
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Yang SGreenstreet M(2005)Noise margin analysis for dynamic logic circuitsProceedings of the 2005 IEEE/ACM International conference on Computer-aided design10.5555/1129601.1129660(406-412)Online publication date: 31-May-2005
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Su HWidiger DKashyap CLiu FKrauter BJoyner WMartin GKahng A(2005)A noise-driven effective capacitance method with fast embedded noise rule calculation for functional noise analysisProceedings of the 42nd annual Design Automation Conference10.1145/1065579.1065630(186-189)Online publication date: 13-Jun-2005
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