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VVDS: a verification/diagnosis system for VHDL

Authors:

H. T. Liaw,

K.-T. Tran,

C.-S. LinAuthors Info & Claims

DAC '89: Proceedings of the 26th ACM/IEEE Design Automation Conference

Pages 435 - 440

https://doi.org/10.1145/74382.74455

Published: 01 June 1989 Publication History

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Abstract

In this paper, an interactive verification and diagnosis system for VHDL [Vm88], VVDS, is presented. In VVDS, hybrid simulation, which simulates with both numerical and symbolic data, is implemented to achieve an effective compromise of the enormous quantity of input test data in the conventional simulation and the complexity of symbolic expression in the symbolic execution. To support efficient user interface in the verification and diagnosis process, both on-line programming of commands and micro-probing capability to passively and actively probe any level of design hierarchy are provided.

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Cited By

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Liaw Heh-Tyan Tsaih Jia-Horng Lin Chen-Shang (1990)Efficient automatic diagnosis of digital circuits1990 IEEE International Conference on Computer-Aided Design. Digest of Technical Papers10.1109/ICCAD.1990.129954(464-467)Online publication date: 1990
https://doi.org/10.1109/ICCAD.1990.129954

Index Terms

VVDS: a verification/diagnosis system for VHDL
1. Computer systems organization
  1. Embedded and cyber-physical systems
    1. Embedded systems
2. Hardware
  1. Hardware validation
    1. Functional verification
      1. Simulation and emulation
  2. Very large scale integration design

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Information & Contributors

Information

Published In

DAC '89: Proceedings of the 26th ACM/IEEE Design Automation Conference

June 1989

839 pages

ISBN:0897913108

DOI:10.1145/74382

Chairman:
Donald E. Thomas
Carnegie Mellon Univ., Pittsburgh, PA

Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

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Association for Computing Machinery

New York, NY, United States

Publication History

Published: 01 June 1989

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DAC89: The 26th ACM/IEEE-CS Design Automation Conference

June 25 - 28, 1989

Nevada, Las Vegas, USA

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DAC '89 Paper Acceptance Rate 156 of 465 submissions, 34%;

Overall Acceptance Rate 1,770 of 5,499 submissions, 32%

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Liaw Heh-Tyan Tsaih Jia-Horng Lin Chen-Shang (1990)Efficient automatic diagnosis of digital circuits1990 IEEE International Conference on Computer-Aided Design. Digest of Technical Papers10.1109/ICCAD.1990.129954(464-467)Online publication date: 1990
https://doi.org/10.1109/ICCAD.1990.129954

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