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PCB Defect Detection and Enhancement System Based on MATLAB

Published: 10 April 2023 Publication History

Abstract

In the process of PCB manufacturing, with the increasing demand, the complexity of IC chips, the number of pins, and the density are getting higher and higher. Therefore, the rationality of PCB layout is particularly important. In many links of PCB production and processing, the quality of solder joints needs to be tested. In recent years, in order to improve the automation and efficiency of PCB solder joint quality inspection, the automatic optical inspection system of PCB solder joint based on CCD camera image has received more and more attention. In this paper, a PCB defect detection and enhancement system based on MATLAB is studied aiming at the problem of PCB solder joint location and defect detection. The main tasks of the system include PCB surface feature image acquisition, image enhancement and segmentation preprocessing, PCB surface feature extraction, neural network model establishment and defect identification, etc., completing PCB defect location and establishing PCB defect data set, in which BP neural network is used as the judgment model of this project, It can meet the current PCB surface defect monitoring requirements.

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ICITEE '22: Proceedings of the 5th International Conference on Information Technologies and Electrical Engineering
November 2022
739 pages
ISBN:9781450396806
DOI:10.1145/3582935
Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than the author(s) must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected].

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Association for Computing Machinery

New York, NY, United States

Publication History

Published: 10 April 2023

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Author Tags

  1. Automatic optical detection
  2. BP neural network
  3. Digital image processing
  4. Image acquisition
  5. Image noise reduction and enhancement

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