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Automatic equivalence check of circuit descriptions at clocked algorithmic and register transfer level (poster paper)

Published: 01 January 2000 Publication History

Abstract

No abstract available.

References

[1]
{1} C. Barrett, D. Dill, and J. Levitt. Validity checking for combinations of theories with equality. In FMCAD'96, pp. 187-201.
[2]
{2} R. Hojati and R. K. Brayton. Automatic datapath abstraction in hardware systems. In CAV'95, pages 98-113, 1995.
[3]
{3} J. Schönherr and B. Straube. A procedure for induction based equivalence check at RT level. Technical Report SFB 358- C1-1/99, TU Dresden, 1999.
[4]
{4} M. K. Srivas and S. P. Miller. Formal Verification of a Commercial Microprocessor. Technical Report SRI-CSL-95-04, SRI Computer Science Laboratory, 1995.

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  1. Automatic equivalence check of circuit descriptions at clocked algorithmic and register transfer level (poster paper)

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        cover image ACM Conferences
        DATE '00: Proceedings of the conference on Design, automation and test in Europe
        January 2000
        707 pages
        ISBN:1581132441
        DOI:10.1145/343647
        Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

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        • EDAA: European Design Automation Association
        • ECSI
        • EDAC: Electronic Design Automation Consortium
        • SIGDA: ACM Special Interest Group on Design Automation
        • IEEE-CS: Computer Society
        • IFIP: International Federation for Information Processing
        • The Russian Academy of Sciences: The Russian Academy of Sciences

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        New York, NY, United States

        Publication History

        Published: 01 January 2000

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        • EDAA
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        • IEEE-CS
        • IFIP
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        DATE00: Design Automation and Test in Europe
        March 27 - 30, 2000
        Paris, France

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        Overall Acceptance Rate 518 of 1,794 submissions, 29%

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