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SAT-based analysis of large real-world feature models is easy

Published: 20 July 2015 Publication History

Abstract

Modern conflict-driven clause-learning (CDCL) Boolean SAT solvers provide efficient automatic analysis of real-world feature models (FM) of systems ranging from cars to operating systems. It is well-known that solver-based analysis of real-world FMs scale very well even though SAT instances obtained from such FMs are large, and the corresponding analysis problems are known to be NP-complete. To better understand why SAT solvers are so effective, we systematically studied many syntactic and semantic characteristics of a representative set of large real-world FMs. We discovered that a key reason why large real-world FMs are easy-to-analyze is that the vast majority of the variables in these models are unrestricted, i.e., the models are satisfiable for both true and false assignments to such variables under the current partial assignment. Given this discovery and our understanding of CDCL SAT solvers, we show that solvers can easily find satisfying assignments for such models without too many backtracks relative to the model size, explaining why solvers scale so well. Further analysis showed that the presence of unrestricted variables in these real-world models can be attributed to their high-degree of variability. Additionally, we experimented with a series of well-known nonbacktracking simplifications that are particularly effective in solving FMs. The remaining variables/clauses after simplifications, called the core, are so few that they are easily solved even with backtracking, further strengthening our conclusions. We explain the connection between our findings and backdoors, an idea posited by theorists to explain the power of SAT solvers. This connection strengthens our hypothesis that SAT-based analysis of FMs is easy. In contrast to our findings, previous research characterizes the difficulty of analyzing randomly-generated FMs in terms of treewidth. Our experiments suggest that the difficulty of analyzing real-world FMs cannot be explained in terms of treewidth.

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cover image ACM Other conferences
SPLC '15: Proceedings of the 19th International Conference on Software Product Line
July 2015
460 pages
ISBN:9781450336130
DOI:10.1145/2791060
Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

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  • Vanderbilt University: Vanderbilt University
  • Biglever: BigLever Software, Inc.

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Association for Computing Machinery

New York, NY, United States

Publication History

Published: 20 July 2015

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  1. SAT-based analysis
  2. feature model

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SPLC '15
Sponsor:
  • Vanderbilt University
  • Biglever

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SPLC '15 Paper Acceptance Rate 34 of 87 submissions, 39%;
Overall Acceptance Rate 167 of 463 submissions, 36%

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  • (2024)Reusing d-DNNFs for Efficient Feature-Model CountingACM Transactions on Software Engineering and Methodology10.1145/368046533:8(1-32)Online publication date: 30-Jul-2024
  • (2024)Beyond Pairwise Testing: Advancing 3-wise Combinatorial Interaction Testing for Highly Configurable SystemsProceedings of the 33rd ACM SIGSOFT International Symposium on Software Testing and Analysis10.1145/3650212.3680309(641-653)Online publication date: 11-Sep-2024
  • (2024)Towards Deterministic Compilation of Binary Decision Diagrams From Feature ModelsProceedings of the 28th ACM International Systems and Software Product Line Conference10.1145/3646548.3672598(136-147)Online publication date: 2-Sep-2024
  • (2024)Preprocessing is What You Need: Understanding and Predicting the Complexity of SAT-based Uniform Random SamplingProceedings of the 2024 IEEE/ACM 12th International Conference on Formal Methods in Software Engineering (FormaliSE)10.1145/3644033.3644371(23-32)Online publication date: 14-Apr-2024
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  • (2024)UnWise: High T-Wise Coverage from Uniform SamplingProceedings of the 18th International Working Conference on Variability Modelling of Software-Intensive Systems10.1145/3634713.3634716(37-45)Online publication date: 7-Feb-2024
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  • (2023)Generating Pairwise Covering Arrays for Highly Configurable Software SystemsProceedings of the 27th ACM International Systems and Software Product Line Conference - Volume A10.1145/3579027.3608998(261-267)Online publication date: 28-Aug-2023
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