Cited By
View all- Pomeranz I(2020)Broad-Brush Compaction for Sequential Test GenerationIEEE Transactions on Very Large Scale Integration (VLSI) Systems10.1109/TVLSI.2020.299209728:8(1940-1944)Online publication date: Aug-2020
- Pomeranz I(2016)Static Test Compaction for Functional Test Sequences With Restoration of Functional Switching ActivityIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.2015.251293135:10(1755-1762)Online publication date: 1-Oct-2016
- Pomeranz I(2015)FOLDACM Transactions on Design Automation of Electronic Systems10.1145/276445520:4(1-19)Online publication date: 28-Sep-2015
- Show More Cited By