More Web Proxy on the site http://driver.im/

research-article

Identification of recovered ICs using fingerprints from a light-weight on-chip sensor

Authors:

Nicholas Tuzzio,

Mohammad TehranipoorAuthors Info & Claims

DAC '12: Proceedings of the 49th Annual Design Automation Conference

Pages 703 - 708

https://doi.org/10.1145/2228360.2228486

Published: 03 June 2012 Publication History

Abstract

The counterfeiting and recycling of integrated circuits (ICs) have become major problems in recent years, potentially impacting the security of electronic systems bound for military, financial, or other critical applications. With identical functionality and packaging, it is extremely difficult to distinguish recovered ICs from unused ICs. A technique is proposed to distinguish used ICs from the unused ones using a fingerprint generated by a light-weight on-chip sensor. Using statistical data analysis, process and temperature variations' effects on the sensors can be separated from aging experienced by the sensors in the ICs when used in the field. Simulation results, featuring the sensor using 90nm technology, and silicon results from 90nm test chips demonstrate the effectiveness of this technique for identification of recovered ICs.

References

[1]

"Defense Industrial Base Assessment: Counterfeit Electronics," Bureau of Industry and Security, U.S. Department of Commence, http://www.bis.doc.gov/defenseindustrialbaseprograms/osies/defmarketresearchrpts/final_counterfeit_electronics_report.pdf, 2010.

[2]

L. W. Kessler and T. Sharpe, "Faked Parts Detection," http://www.circuitsassembly.com/cms/component/content/article/159/9937-smt, 2010.

[3]

Business Week, "Dangerous Fakes," http://www.businessweek.com/magazine/content/08_41/b4103034193886.htm, 2008.

[4]

Military Times, "Officials: Fake Electronics Ticking Time Bombs," http://www.militarytimes.com/news/2011/11/ap-fake-electronics-ticking-time-bomb-110811/, 2011.

[5]

Tezzaron Semiconductor, "3D-ICs and Integrated Circuit Security," http://www.tezzaron.com/about/papers/3D-ICs_and_Integrated_Circuit_Security.pdf, 2008.

[6]

http://www.combatcounterfeits.com/gallery.htm

[7]

J. Stradley and D. Karraker, "The Electronic Part Supply Chain and Risks of Counterfeit Parts in Defense Applications," IEEE Transactions on Components and Packaging Technologies, pp. 703--705, Sept. 2006.

[8]

M. Tehranipoor, and C, Wang "Introduction to Hardware Security and Trust," Springer, New York, USA, 2011.

Digital Library

[9]

K. Lofstrom, W. R. Daasch, and D. Taylor, "IC Identification Circuit Using Device Mismatch," in Proc. ISSCC, pp. 370--371, 2000.

[10]

R. Pappu, "Physical One-way Functions," Phd thesis, MIT, 2001.

[11]

G. Suh and S. Devadas, "Physical Unclonable Functions for Device Authentication and Secret Key Generation," in Proc. DAC, pp. 9--14, 2007.

Digital Library

[12]

E. Ozturk, G. Hammouri, and B. Sunar, "Physical Unclonable Function with Tristate Buffers," in Proc. ISCAS, pp. 3194--3197, 2008.

[13]

A. Maiti and P. Schaumont, "Improved Ring Oscillator PUF: An FPGA-Friendly Secure Primitive," IACR Journal of Cryptology, special issue on Secure Hardware, 2011.

Digital Library

[14]

F. Koushanfar "Hardware Metering: A Survey," http://aceslab.org/sites/default/files/05-fk-metering.pdf

Digital Library

[15]

J. Roy, F. Koushanfar, and I. Markov, "EPIC: Ending Piracy of Integrated Circuits," in proc. DATE08, pp. 1069--1074, 2008.

Digital Library

[16]

A. Baumgarten, A. Tyagi, and J. Zambreno, "Preventing IC Piracy Using Reconfigurable Logic Barriers," IEEE Design & Test of Computers, 2010.

Digital Library

[17]

T. Kim, R. Persaud, and C. H. Kim, "Silicon Odometer: An On-Chip Reliability Monitor for Measuring Frequency Degradation of Digital Circuits," IEEE Journal of Solid-State Circuits, pp. 974--880, 2008

[18]

J. Keane, X. Wang, D. Persaud, and C. H. Kim, "An All-In-One Silicon Odometer for Separately Monitoring HCI, BTI, and TDDB," IEEE Journal of Solid-State Circuits, pp. 817--829, 2010

[19]

S. Mahapatra, D. Saha, D. Varghese, and P. B. Kumar, "On the Generation and Recovery of Interface Traps in MOSFETs Subjected to NBTI, FN, and HCI Stress," IEEE Trans. on Electron Devices, vol. 53, no. 7, pp. 1583--1592, 2006.

[20]

"http://www.synopsys.com/Community/UniversityProgram/Pages/Library.aspx".

[21]

K. Uwasawa, T. Yamamoto, and T. Mogami, "A New Degradation Mode of Scaled P+ Polysilicon Gate P-MOSFETs Induced by Bias Temperature Instability," in Proc. Int. Electron Devices Meeting, pp. 871--874, 1995.

[22]

P. Heremans, R. Bellens, G. Groeseneken, and H. E. Maes, "Consistent Model for the Hot Carrier Degradation in N-Channel and P-Channel MOSFETs," IEEE Trans. Electron Devices, vol. 35, no. 12, pp. 2194--2209, 1988.

[23]

H. Luo, Y. Wang, K. He, R. Luo, H. Yang, and Y. Xie "Modeling of PMOS NBTI Effect Considering Temperature Variation." in Proc. ISQED, pp. 139--144, 2007.

Digital Library

[24]

R. Vattikonda; W. Wang; Y. Cao; "Modeling and Minimization of PMOS NBTI Effect for Robust Nanometer Design," in Proc. DAC, pp. 1047--1052, 2006.

Digital Library

Cited By

Odom GTisha ZGuin U(2024)A Novel Self-referencing Approach Using Memory Power-up States for Detecting COTS SRAMs2024 IEEE 42nd VLSI Test Symposium (VTS)10.1109/VTS60656.2024.10538766(1-7)Online publication date: 22-Apr-2024
https://doi.org/10.1109/VTS60656.2024.10538766
Ul Islam Sami MZhou JSaha SRahman FFarahmandi FTehranipoor M(2024)SAP: Silicon Authentication Platform for System-on-Chip Supply Chain Vulnerabilities2024 IEEE International Symposium on Performance Analysis of Systems and Software (ISPASS)10.1109/ISPASS61541.2024.00020(109-119)Online publication date: 5-May-2024
https://doi.org/10.1109/ISPASS61541.2024.00020
Bahar Talukder BFerdaus FRahman M(2023)A Noninvasive Technique to Detect Authentic/Counterfeit SRAM ChipsACM Journal on Emerging Technologies in Computing Systems10.1145/359702419:2(1-25)Online publication date: 30-May-2023
https://dl.acm.org/doi/10.1145/3597024
Show More Cited By

Index Terms

Identification of recovered ICs using fingerprints from a light-weight on-chip sensor
1. Hardware
  1. Robustness

Recommendations

A New Aging Sensor for the Detection of Recycled ICs
GLSVLSI '20: Proceedings of the 2020 on Great Lakes Symposium on VLSI

The electronics industry has become the main target of counterfeiting. Integrated circuits (ICs) are highly vulnerable to various types of counterfeiting such as recycling. The recycled ICs do not have the performance and service lifetime of the genuine ...
Path-delay fingerprinting for identification of recovered ICs
DFT '12: Proceedings of the 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)

The counterfeiting of integrated circuits (ICs) has been on the rise over the past decade, impacting the security and reliability of electronic systems. Reports show that recovered ICs contribute to about 80% of all counterfeit ICs in the market today. ...
The Dependence of BTI and HCI-Induced Frequency Degradation on Interconnect Length and Its Circuit Level Implications
The dependence of bias temperature instability (BTI) and hot carrier injection (HCI)-induced frequency degradation on interconnect length has been examined for the first time. Experimental data from 65-nm test chips show that frequency degradation due to ...

Comments

Please enable JavaScript to view thecomments powered by Disqus.

Information & Contributors

Information

Published In

cover image ACM Conferences

DAC '12: Proceedings of the 49th Annual Design Automation Conference

June 2012

1357 pages

ISBN:9781450311991

DOI:10.1145/2228360

General Chair:
Patrick Groeneveld
Magma Design Automation, Inc., San Jose, CA
,
Program Chairs:
Donatella Sciuto
Politecnico di Milano, Milano, Italy
,
Soha Hassoun
Tufts Univ., Medford, MA

Copyright © 2012 ACM.

Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

Sponsors

EDAC: Electronic Design Automation Consortium
SIGDA: ACM Special Interest Group on Design Automation
IEEE-CEDA

In-Cooperation

SIGBED: ACM Special Interest Group on Embedded Systems

Publisher

Association for Computing Machinery

New York, NY, United States

Publication History

Published: 03 June 2012

Permissions

Request permissions for this article.

Request Permissions

Check for updates

Author Tags

Qualifiers

Research-article

Conference

DAC '12

Sponsor:

EDAC
SIGDA

DAC '12: The 49th Annual Design Automation Conference 2012

June 3 - 7, 2012

California, San Francisco

Acceptance Rates

Overall Acceptance Rate 1,770 of 5,499 submissions, 32%

Upcoming Conference

DAC '25

Sponsor:
sigda

62nd ACM/IEEE Design Automation Conference

June 22 - 26, 2025

San Francisco , CA , USA

Contributors

Other Metrics

View Article Metrics

Bibliometrics & Citations

Bibliometrics

Article Metrics

60
Total Citations
View Citations
327
Total Downloads

Downloads (Last 12 months)15
Downloads (Last 6 weeks)2

Reflects downloads up to 13 Dec 2024

Other Metrics

View Author Metrics

Citations

Cited By

Odom GTisha ZGuin U(2024)A Novel Self-referencing Approach Using Memory Power-up States for Detecting COTS SRAMs2024 IEEE 42nd VLSI Test Symposium (VTS)10.1109/VTS60656.2024.10538766(1-7)Online publication date: 22-Apr-2024
https://doi.org/10.1109/VTS60656.2024.10538766
Ul Islam Sami MZhou JSaha SRahman FFarahmandi FTehranipoor M(2024)SAP: Silicon Authentication Platform for System-on-Chip Supply Chain Vulnerabilities2024 IEEE International Symposium on Performance Analysis of Systems and Software (ISPASS)10.1109/ISPASS61541.2024.00020(109-119)Online publication date: 5-May-2024
https://doi.org/10.1109/ISPASS61541.2024.00020
Bahar Talukder BFerdaus FRahman M(2023)A Noninvasive Technique to Detect Authentic/Counterfeit SRAM ChipsACM Journal on Emerging Technologies in Computing Systems10.1145/359702419:2(1-25)Online publication date: 30-May-2023
https://dl.acm.org/doi/10.1145/3597024
Surabhi VKrishnamurthy PAmrouch HHenkel JKarri RKhorrami F(2023)Golden-Free Robust Age Estimation to Triage Recycled ICsIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.2023.323829142:9(2839-2851)Online publication date: Sep-2023
https://doi.org/10.1109/TCAD.2023.3238291
Wali ADas S(2023)Hardware and Information Security Primitives Based on 2D Materials and DevicesAdvanced Materials10.1002/adma.20220536535:18Online publication date: 8-Mar-2023
https://doi.org/10.1002/adma.202205365
Martinez AKhursheed SAlnuayri TRossi D(2022)Online Remaining Useful Lifetime Prediction Using Support Vector RegressionIEEE Transactions on Emerging Topics in Computing10.1109/TETC.2021.310625210:3(1546-1557)Online publication date: 1-Jul-2022
https://doi.org/10.1109/TETC.2021.3106252
Tehranipoor MPundir NVashistha NFarahmandi FTehranipoor MPundir NVashistha NFarahmandi F(2022)Extrinsic Direct Characterization PUFHardware Security Primitives10.1007/978-3-031-19185-5_5(63-79)Online publication date: 12-Oct-2022
https://doi.org/10.1007/978-3-031-19185-5_5
Tehranipoor MPundir NVashistha NFarahmandi FTehranipoor MPundir NVashistha NFarahmandi F(2022)Counterfeit and Recycled IC DetectionHardware Security Primitives10.1007/978-3-031-19185-5_16(281-300)Online publication date: 12-Oct-2022
https://doi.org/10.1007/978-3-031-19185-5_16
Alnuayri TKhursheed SHernandez Martinez ARossi D(2021)Differential Aging Sensor to Detect Recycled ICs using Sub-threshold Leakage Current2021 Design, Automation & Test in Europe Conference & Exhibition (DATE)10.23919/DATE51398.2021.9473975(1500-1503)Online publication date: 1-Feb-2021
https://doi.org/10.23919/DATE51398.2021.9473975
Alnuayri TKhursheed SMartinez ARossi D(2021)Differential Aging Sensor Using Subthreshold Leakage Current to Detect Recycled ICsIEEE Transactions on Very Large Scale Integration (VLSI) Systems10.1109/TVLSI.2021.311524729:12(2064-2075)Online publication date: Dec-2021
https://doi.org/10.1109/TVLSI.2021.3115247
Show More Cited By

View Options

Login options

Check if you have access through your login credentials or your institution to get full access on this article.

Full Access

Get this Publication

View options

PDF

View or Download as a PDF file.

eReader

View online with eReader.

Media

Figures

Other

Tables

View Table of Contents