[go: up one dir, main page]
More Web Proxy on the site http://driver.im/ skip to main content
10.1145/2024724.2024799acmconferencesArticle/Chapter ViewAbstractPublication PagesdacConference Proceedingsconference-collections
research-article

Performance bound analysis of analog circuits considering process variations

Published: 05 June 2011 Publication History

Abstract

In this paper, we propose a new performance bound analysis of analog circuits considering process variations. We model the variations of component values as intervals measured from tested chip and manufacture processes. The new method applies a graph-based symbolic analysis and affine interval arithmetic to derive the variational transfer functions of analog circuits (linearized) with variational coefficients in forms of intervals. Then the frequency response bounds (maximum and minimum) are obtained by performing analysis of a finite number of transfer functions given by the Kharitonov's polynomial functions. We show that symbolic de-cancellation is critical for the affine interval analysis. The response bound given by the Kharitonov's functions are conservative given the correlations among coefficient intervals in transfer functions. Experimental results demonstrate the effectiveness of the proposed compared to the Monte Carlo method.

References

[1]
S. Dasgupta, "Kharitonov's theorem revisited," Systems & Control Letters, vol. 11, no. 5, pp. 381--384, 1988.
[2]
L. H. de Figueiredo and J. Stolfi, "Self-validated numerical methods and applications," in Brazilian Mathematics Colloquium monographs, IMPA/CNPq, Rio de Janeiro, Brazil, 1997.
[3]
V. L. Kharitonov, "Asymptotic stability of an equilibrium position of a family of systems of linear differential equations," Differential. Uravncn., vol. 14, pp. 2086--2088, 1978.
[4]
J. Kim, K. Jones, and M. Horowitz, "Fast, non-monte-carlo estimation of transient performance variation due to device mismatch," in Proc. IEEE/ACM Design Automation Conference (DAC), 2007.
[5]
L. Kolev, V. Mladenov, and S. Vladov, "Interval mathematics algorithms for tolerance analysis," IEEE Trans. on Circuits and Systems, vol. 35, no. 8, pp. 967--975, Aug. 1988.
[6]
A. Levkovich, E. Zeheb, and N. Cohen, "Frequency response envelopes of a family of uncertain continuous-time systems," IEEE Trans. on Circuits and Systems I: Fundamental Theory and Applications, vol. 42, no. 3, pp. 156--165, Mar. 1995.
[7]
H. Masuda, S. Ohkawa, A. Kurokawa, and M. Aoki, "Challenge: Variability characterization and modeling for 65-to 90-nm processes," in Proc. IEEE Custom Integrated Circuits Conf., 2005.
[8]
R. E. Moore, Interval Analysis. Prentice-Hall, 1966.
[9]
S. Nassif, "Model to hardware correlation for nm-scale technologies," in Proc. IEEE International Workshop on Behavioral Modeling and Simulation (BMAS), Sept 2007, keynote speech.
[10]
D. C. Olivier Gay and N. Hurst, "Libaffa: C++ affine arithmetic library for gnu/linux. available at http://savannah.nongnu.org/projects/libaa/," May 2005.
[11]
M. Pelgrom, A. Duinmaijer, and A. Welbers, "Matching properties of mos transistors," IEEE J. Solid-State Circuits, pp. 1433--1439, 1989.
[12]
L. Qian, D. Zhou, S. Wang, and X. Zeng, "Worst case analysis of linear analog circuit performance based on Kharitonov's rectangle," in Proc. IEEE Int. Conf. on Solid-State and Integrated Circuit Technology (ICSICT), Nov. 2010.
[13]
R. Rutenbar, "Next-generation design and EDA challenges," in Proc. Asia South Pacific Design Automation Conf. (ASPDAC), January 2007, keynote speech.
[14]
A. S. Sedra and K. C. Smith, Microelectronic Circuits. Oxford University Press, USA, 2009.
[15]
C.-J. Shi and X.-D. Tan, "Canonical symbolic analysis of large analog circuits with determinant decision diagrams," IEEE Trans. on Computer-Aided Design of Integrated Circuits and Systems, vol. 19, no. 1, pp. 1--18, Jan. 2000.
[16]
C.-J. Shi and X.-D. Tan, "Compact representation and efficient generation of s-expanded symbolic network functions for computer-aided analog circuit design," IEEE Trans. on Computer-Aided Design of Integrated Circuits and Systems, vol. 20, no. 7, pp. 813--827, April 2001.
[17]
C.-J. R. Shi and M. W. Tian, "Simulation and sensitivity of linear analog circuits under parameter variations by robust interval analysis," ACM Trans. Des. Autom. Electron. Syst., vol. 4, pp. 280--312, July 1999.
[18]
R. Spence and R. Soin, Tolerance Design of Electronic Circuits. Addison-Wesley, Reading, MA., 1988.
[19]
S. X.-D. Tan, W. Guo, and Z. Qi, "Hierarchical approach to exact symbolic analysis of large analog circuits," IEEE Trans. on Computer-Aided Design of Integrated Circuits and Systems, vol. 24, no. 8, pp. 1241--1250, August 2005.
[20]
S. X.-D. Tan and C.-J. Shi, "Efficient DDD-based interpretable symbolic characterization of large analog circuits," IEICE Trans. on Fundamentals of Electronics, Communications and Computer Science(IEICE), vol. E86-A, no. 12, pp. 3112--3118, Dec. 2003.
[21]
S. X.-D. Tan and C.-J. Shi, "Efficient approximation of symbolic expressions for analog behavioral modeling and analysis," IEEE Trans. on Computer-Aided Design of Integrated Circuits and Systems, vol. 23, no. 6, pp. 907--918, June 2004.
[22]
W. Tian, X.-T. Ling, and R.-W. Liu, "Novel methods for circuit worst-case tolerance analysis," IEEE Trans. on Circuits and Systems I: Fundamental Theory and Applications, vol. 43, no. 4, pp. 272--278, Apr. 1996.
[23]
J. Vlach and K. Singhal, Computer Methods for Circuit Analysis and Design. New York, NY: Van Nostrand Reinhold, 1995.

Cited By

View all
  • (2016)A Zonotoped Macromodeling for Eye-Diagram Verification of High-Speed I/O Links With Jitter and Parameter VariationsIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.2015.248187335:6(1040-1051)Online publication date: Jun-2016
  • (2016)Circuit tolerance design by differential evolution with hybrid analysis method2016 Eighth International Conference on Advanced Computational Intelligence (ICACI)10.1109/ICACI.2016.7449806(74-78)Online publication date: Feb-2016
  • (2016)A yield-enhanced global optimization methodology for analog circuit based on extreme value theoryScience China Information Sciences10.1007/s11432-015-0471-459:8Online publication date: 7-Jun-2016
  • Show More Cited By

Index Terms

  1. Performance bound analysis of analog circuits considering process variations

    Recommendations

    Comments

    Please enable JavaScript to view thecomments powered by Disqus.

    Information & Contributors

    Information

    Published In

    cover image ACM Conferences
    DAC '11: Proceedings of the 48th Design Automation Conference
    June 2011
    1055 pages
    ISBN:9781450306362
    DOI:10.1145/2024724
    Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

    Sponsors

    Publisher

    Association for Computing Machinery

    New York, NY, United States

    Publication History

    Published: 05 June 2011

    Permissions

    Request permissions for this article.

    Check for updates

    Author Tags

    1. interval
    2. performance bound
    3. process variation
    4. symbolic

    Qualifiers

    • Research-article

    Funding Sources

    Conference

    DAC '11
    Sponsor:

    Acceptance Rates

    Overall Acceptance Rate 1,770 of 5,499 submissions, 32%

    Upcoming Conference

    DAC '25
    62nd ACM/IEEE Design Automation Conference
    June 22 - 26, 2025
    San Francisco , CA , USA

    Contributors

    Other Metrics

    Bibliometrics & Citations

    Bibliometrics

    Article Metrics

    • Downloads (Last 12 months)5
    • Downloads (Last 6 weeks)1
    Reflects downloads up to 11 Dec 2024

    Other Metrics

    Citations

    Cited By

    View all
    • (2016)A Zonotoped Macromodeling for Eye-Diagram Verification of High-Speed I/O Links With Jitter and Parameter VariationsIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.2015.248187335:6(1040-1051)Online publication date: Jun-2016
    • (2016)Circuit tolerance design by differential evolution with hybrid analysis method2016 Eighth International Conference on Advanced Computational Intelligence (ICACI)10.1109/ICACI.2016.7449806(74-78)Online publication date: Feb-2016
    • (2016)A yield-enhanced global optimization methodology for analog circuit based on extreme value theoryScience China Information Sciences10.1007/s11432-015-0471-459:8Online publication date: 7-Jun-2016
    • (2015)Analog circuit performance bound estimation based on extreme value theory2015 IEEE 58th International Midwest Symposium on Circuits and Systems (MWSCAS)10.1109/MWSCAS.2015.7282062(1-4)Online publication date: Aug-2015
    • (2015)Fast statistical analysis of nonlinear analog circuits using model order reductionAnalog Integrated Circuits and Signal Processing10.1007/s10470-015-0588-x85:3(379-394)Online publication date: 1-Dec-2015
    • (2014)A zonotoped macromodeling for reachability verification of eye-diagram in high-speed I/O links with jitterProceedings of the 2014 IEEE/ACM International Conference on Computer-Aided Design10.5555/2691365.2691506(696-701)Online publication date: 3-Nov-2014
    • (2014)Zonotope-based nonlinear model order reduction for fast performance bound analysis of analog circuits with multiple-interval-valued parameter variationsProceedings of the conference on Design, Automation & Test in Europe10.5555/2616606.2616621(1-6)Online publication date: 24-Mar-2014
    • (2014)Simulation Based Verification with Range Based Signal Representations for Mixed-Signal SystemsProceedings of the 27th Symposium on Integrated Circuits and Systems Design10.1145/2660540.2661010(1-7)Online publication date: 1-Sep-2014
    • (2014)A zonotoped macromodeling for reachability verification of eye-diagram in high-speed I/O links with jitter2014 IEEE/ACM International Conference on Computer-Aided Design (ICCAD)10.1109/ICCAD.2014.7001428(696-701)Online publication date: Nov-2014
    • (2014)Time-domain performance bound analysis for analog and interconnect circuits considering process variations2014 19th Asia and South Pacific Design Automation Conference (ASP-DAC)10.1109/ASPDAC.2014.6742933(455-460)Online publication date: Jan-2014
    • Show More Cited By

    View Options

    Login options

    View options

    PDF

    View or Download as a PDF file.

    PDF

    eReader

    View online with eReader.

    eReader

    Media

    Figures

    Other

    Tables

    Share

    Share

    Share this Publication link

    Share on social media