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Perturbation analysis of high level instrumentation for SPMD programs

Published: 01 July 1993 Publication History

Abstract

The process of instrumenting a program to study its behavior can lead to perturbations in the program's execution. These perturbations can become severe for large parallel systems or problem sizes, even when one captures only high level events. In this paper, we address the important issue of eliminating execution perturbations caused by high-level instrumentation of SPMD programs. We will describe perturbation analysis techniques for common computation and communication measurements, and show examples which demonstrate the effectiveness of these techniques in practice.

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  • (2006)The Tau Parallel Performance SystemInternational Journal of High Performance Computing Applications10.1177/109434200606448220:2(287-311)Online publication date: 1-May-2006
  • (2005)Models for on-the-fly compensation of measurement overhead in parallel performance profilingProceedings of the 11th international Euro-Par conference on Parallel Processing10.1007/11549468_11(72-82)Online publication date: 30-Aug-2005
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Information

Published In

cover image ACM SIGPLAN Notices
ACM SIGPLAN Notices  Volume 28, Issue 7
July 1993
259 pages
ISSN:0362-1340
EISSN:1558-1160
DOI:10.1145/173284
Issue’s Table of Contents
  • cover image ACM Conferences
    PPOPP '93: Proceedings of the fourth ACM SIGPLAN symposium on Principles and practice of parallel programming
    August 1993
    259 pages
    ISBN:0897915895
    DOI:10.1145/155332
Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

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Association for Computing Machinery

New York, NY, United States

Publication History

Published: 01 July 1993
Published in SIGPLAN Volume 28, Issue 7

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Cited By

View all
  • (2013)Provenance from log filesProceedings of the Joint EDBT/ICDT 2013 Workshops10.1145/2457317.2457366(290-297)Online publication date: 18-Mar-2013
  • (2006)The Tau Parallel Performance SystemInternational Journal of High Performance Computing Applications10.1177/109434200606448220:2(287-311)Online publication date: 1-May-2006
  • (2005)Models for on-the-fly compensation of measurement overhead in parallel performance profilingProceedings of the 11th international Euro-Par conference on Parallel Processing10.1007/11549468_11(72-82)Online publication date: 30-Aug-2005
  • (2004)Overhead Compensation in Performance ProfilingEuro-Par 2004 Parallel Processing10.1007/978-3-540-27866-5_16(119-132)Online publication date: 2004
  • (1999)Profiling techniques for communication in fine-grained parallel languagesSoftware: Practice and Experience10.1002/(SICI)1097-024X(199905)29:6<519::AID-SPE247>3.0.CO;2-W29:6(519-550)Online publication date: May-1999
  • (1996)Profiling a parallel language based on fine-grained communicationProceedings of the 1996 ACM/IEEE conference on Supercomputing10.1145/369028.369063(17-es)Online publication date: 17-Nov-1996
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  • (2007)Towards scalable event tracing for high end systemsProceedings of the Third international conference on High Performance Computing and Communications10.5555/2401945.2402022(695-706)Online publication date: 26-Sep-2007
  • (2007)Compensation of Measurement Overhead in Parallel Performance ProfilingInternational Journal of High Performance Computing Applications10.1177/109434200707786221:2(174-194)Online publication date: 1-May-2007
  • (2007)Understanding Measurement Perturbation in Trace-based Data2007 IEEE International Parallel and Distributed Processing Symposium10.1109/IPDPS.2007.370515(1-6)Online publication date: Mar-2007
  • Show More Cited By

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