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Managing software defects: defect analysis and traceability

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Craig HendersonAuthors Info & Claims

ACM SIGSOFT Software Engineering Notes, Volume 33, Issue 4

Article No.: 2, Pages 1 - 3

https://doi.org/10.1145/1384139.1384141

Published: 01 July 2008 Publication History

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Abstract

This paper describes a mechanism for presenting software defect metrics to aid analysis. A graphical representation of the history of software builds is presented, that records software build quality in a way that cannot be displayed in a single numerical table, and is visually more appealing and more easily digestible than a series of related tables. The radial analysis charts can be used to represent derivative information in a two-dimensional form and is demonstrated with practical examples of Defect Analysis and Root Cause Analysis.

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Koval LKnollmeyer SMathias SAsif SUzair Akmal MGrossmann DBregulla M(2024)Unlocking the Potential of Information Modeling for Root Cause Analysis in a Production Environment: A Comprehensive State-of-the-Art Review Using the Kitchenham MethodologyIEEE Access10.1109/ACCESS.2024.340602012(80266-80282)Online publication date: 2024
https://doi.org/10.1109/ACCESS.2024.3406020
Abuta ETian JGrechanik MAlonso JNikora A(2015)Defect analysis over multiple release versions of a semiconductor software systemProceedings of the First International Workshop on Complex faUlts and Failures in LargE Software Systems10.5555/2819419.2819431(55-61)Online publication date: 16-May-2015
https://dl.acm.org/doi/10.5555/2819419.2819431
Abuta ETian J(2015)Defect Analysis over Multiple Release Versions of a Semiconductor Software SystemProceedings of the 2015 IEEE/ACM 1st International Workshop on Complex faUlts and Failures in LargE Software Systems10.1109/COUFLESS.2015.16(55-61)Online publication date: 23-May-2015
https://dl.acm.org/doi/10.1109/COUFLESS.2015.16
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Managing software defects: defect analysis and traceability

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Published In

cover image ACM SIGSOFT Software Engineering Notes

ACM SIGSOFT Software Engineering Notes Volume 33, Issue 4

July 2008

69 pages

ISSN:0163-5948

DOI:10.1145/1384139

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Publisher

Association for Computing Machinery

New York, NY, United States

Publication History

Published: 01 July 2008

Published in SIGSOFT Volume 33, Issue 4

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Koval LKnollmeyer SMathias SAsif SUzair Akmal MGrossmann DBregulla M(2024)Unlocking the Potential of Information Modeling for Root Cause Analysis in a Production Environment: A Comprehensive State-of-the-Art Review Using the Kitchenham MethodologyIEEE Access10.1109/ACCESS.2024.340602012(80266-80282)Online publication date: 2024
https://doi.org/10.1109/ACCESS.2024.3406020
Abuta ETian JGrechanik MAlonso JNikora A(2015)Defect analysis over multiple release versions of a semiconductor software systemProceedings of the First International Workshop on Complex faUlts and Failures in LargE Software Systems10.5555/2819419.2819431(55-61)Online publication date: 16-May-2015
https://dl.acm.org/doi/10.5555/2819419.2819431
Abuta ETian J(2015)Defect Analysis over Multiple Release Versions of a Semiconductor Software SystemProceedings of the 2015 IEEE/ACM 1st International Workshop on Complex faUlts and Failures in LargE Software Systems10.1109/COUFLESS.2015.16(55-61)Online publication date: 23-May-2015
https://dl.acm.org/doi/10.1109/COUFLESS.2015.16
McCallum SMackie J(2013)WebTics: A Web Based Telemetry and Metrics System for Small and Medium GamesGame Analytics10.1007/978-1-4471-4769-5_10(169-193)Online publication date: 6-Mar-2013
https://doi.org/10.1007/978-1-4471-4769-5_10

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Recommendations

A method for investigating the quality of evolving object-oriented software using defects in global software development projects

Mining software defects: should we consider affected releases?

Monitoring Software Quality Evolution for Defects